{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T14:49:36Z","timestamp":1729608576384,"version":"3.28.0"},"reference-count":29,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/socc.2004.1362334","type":"proceedings-article","created":{"date-parts":[[2004,12,23]],"date-time":"2004-12-23T09:34:02Z","timestamp":1103794442000},"page":"13-18","source":"Crossref","is-referenced-by-count":1,"title":["On-chip testing of embedded silicon transducers"],"prefix":"10.1109","author":[{"given":"S.","family":"Mir","sequence":"first","affiliation":[]},{"given":"B.","family":"Charlot","sequence":"additional","affiliation":[]},{"given":"L.","family":"Rufer","sequence":"additional","affiliation":[]},{"given":"B.","family":"Courtois","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","first-page":"273","article-title":"Integrated test support for micro-electro-mechanical-systems (MEMS)","author":"olbrich","year":"1996","journal-title":"5th International Conference on Micro- Electro- Opto- Mechanical Systems and Components"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/54.808204"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1996.494350"},{"key":"15","doi-asserted-by":"crossref","first-page":"190","DOI":"10.1117\/12.324056","article-title":"Failure analysis of surface-micromachined microengines","volume":"3512","author":"peterson","year":"1998","journal-title":"Materials and Device Characterization in Micromachining Symposium"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1997.597231"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743197"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639707"},{"key":"11","article-title":"A new concept for a self-testable pressure sensor based on the bimetal effect","author":"cozma","year":"1999","journal-title":"10th Int Conf Solid-State Sensors and Actuators (Transducers 99)"},{"key":"12","doi-asserted-by":"crossref","first-page":"1173","DOI":"10.1109\/43.662678","article-title":"Pseudorandom testing for mixed-signals circuits","volume":"16","author":"pan","year":"1997","journal-title":"IEEE Trans on Computer-Aided Design of Integrated Circuits and Systems"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1012707303725"},{"key":"20","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1023\/A:1008303717862","article-title":"Extending fault-based testing to microelectromechanical systems","volume":"16","author":"mir","year":"2000","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"22","first-page":"1192","article-title":"Testing of droplet-based microelectrofluidic systems","author":"su","year":"2003","journal-title":"IEEE International Test Conference"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766677"},{"key":"24","doi-asserted-by":"crossref","first-page":"439","DOI":"10.1023\/A:1012759320563","article-title":"Test and testability of a monolithic MEMS for magnetic field sensing","volume":"17","author":"veroulle","year":"2001","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"25","doi-asserted-by":"crossref","first-page":"70","DOI":"10.1117\/12.341215","article-title":"Fault simulation of MEMS using HDLs","author":"chariot","year":"1999","journal-title":"SPIE Symposium on Design Test and Microfabrication of MEMS\/MOEMS"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840828"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2692(03)00162-9"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/DTIP.2003.1287007"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347607"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/54.808207"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266317"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1002\/1527-2648(200110)3:10<788::AID-ADEM788>3.0.CO;2-L"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/SENSOR.2003.1215238"},{"journal-title":"ADXL50 Technical Note","article-title":"Monolithic accelerometer with signal conditioning","year":"1996","key":"7"},{"key":"6","doi-asserted-by":"crossref","first-page":"190","DOI":"10.1016\/0924-4247(94)00888-O","article-title":"Airbag application: A microsystem including a silicon capacitive accelerometer, CMOS switched capacitor electronics and true self-test capability","volume":"46 47","author":"zimmermann","year":"1995","journal-title":"Sensors and Actuators A"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1016\/0250-6874(89)87113-6"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1023\/A:1012860420235"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(96)01436-7"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041864"}],"event":{"name":"IEEE International SOC Conference, 2004. Proceedings.","location":"Santa Clara, CA, USA"},"container-title":["IEEE International SOC Conference, 2004. Proceedings."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9408\/29848\/01362334.pdf?arnumber=1362334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T13:43:29Z","timestamp":1497620609000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1362334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/socc.2004.1362334","relation":{},"subject":[]}}