{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T19:30:51Z","timestamp":1725564651745},"reference-count":25,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,9]]},"DOI":"10.1109\/socc.2010.5784738","type":"proceedings-article","created":{"date-parts":[[2011,6,10]],"date-time":"2011-06-10T15:57:50Z","timestamp":1307721470000},"page":"213-218","source":"Crossref","is-referenced-by-count":0,"title":["Estimation of maximum application-level power supply noise"],"prefix":"10.1109","author":[{"given":"Tung-Yeh","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sriram","family":"Sambamurthy","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jacob A.","family":"Abraham","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"384","DOI":"10.1145\/157485.164941","article-title":"resolving signal correlations for estimating maximum currents in cmos combinational circuits","author":"kriplani","year":"1993","journal-title":"30th ACM\/IEEE Design Automation Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2006.4380838"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2000.855296"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.49"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2009.4810387"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2005.65"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/92.924055"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.2002.1057909"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EPEP.2008.4675862"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669136"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.5194\/ars-5-279-2007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2007.4419002"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.79"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.842853"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266176"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"744","DOI":"10.1145\/277044.277231","article-title":"Full-chip verification methods for DSM power distribution systems","author":"steele","year":"1998","journal-title":"Proceedings 1998 Design and Automation Conference 35th DAC (Cat No 98CH36175) DAC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/280756.280915"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.1997.621276"},{"journal-title":"CMOS VLSI Design A Circuits and Systems Perspective","year":"0","author":"weste","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1093\/comjnl\/7.2.155"},{"journal-title":"OR1200 processor","year":"0","key":"ref22"},{"key":"ref21","first-page":"61","article-title":"Reactive Search: Toward Self-Tuning Heuristics","author":"battiti","year":"1996","journal-title":"Modern Heuristic Search Methods"},{"journal-title":"Reactive Tabu Search","year":"0","key":"ref24"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1287\/ijoc.1.3.190"},{"journal-title":"BMC engine of Symbolic Model Verifier","year":"0","key":"ref25"}],"event":{"name":"2010 IEEE International SOC Conference (SOCC)","start":{"date-parts":[[2010,9,27]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2010,9,29]]}},"container-title":["23rd IEEE International SOC Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5755492\/5784634\/05784738.pdf?arnumber=5784738","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T01:25:11Z","timestamp":1497921911000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5784738\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,9]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/socc.2010.5784738","relation":{},"subject":[],"published":{"date-parts":[[2010,9]]}}}