{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T12:13:16Z","timestamp":1771330396561,"version":"3.50.1"},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,9]]},"DOI":"10.1109\/socc.2012.6398362","type":"proceedings-article","created":{"date-parts":[[2013,1,7]],"date-time":"2013-01-07T19:13:06Z","timestamp":1357585986000},"page":"283-288","source":"Crossref","is-referenced-by-count":6,"title":["Mutation-analysis driven functional verification of a soft microprocessor"],"prefix":"10.1109","author":[{"given":"Tao","family":"Xie","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wolfgang","family":"Mueller","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Florian","family":"Letombe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","year":"0"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/1276958.1277172"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/32.57624"},{"key":"13","article-title":"Coverage-directed generation of biased random inputs for functional validation of sequential circuits","author":"tasiran","year":"2001","journal-title":"Int Workshop Logic Synthesis"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.884494"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/343647.343802"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219010"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837333"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2010.5496659"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2007.4341472"},{"key":"10","year":"2008","journal-title":"MicroBlaze Processor Reference Guide"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.83"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1982.235571"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456903"},{"key":"4","article-title":"A practical approach to measuring and improving the functional verification of embedded software","author":"bouvier","year":"2012","journal-title":"Proc of DVCon"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TAIC.PART.2007.39"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/32.92910"}],"event":{"name":"2012 IEEE 25th International SOC Conference (SOCC)","location":"Niagara Falls, NY, USA","start":{"date-parts":[[2012,9,12]]},"end":{"date-parts":[[2012,9,14]]}},"container-title":["2012 IEEE International SOC Conference"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6387373\/6398324\/06398362.pdf?arnumber=6398362","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:35:38Z","timestamp":1490207738000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6398362\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,9]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/socc.2012.6398362","relation":{},"subject":[],"published":{"date-parts":[[2012,9]]}}}