{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T05:26:26Z","timestamp":1729661186868,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/socc.2014.6948923","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:41:20Z","timestamp":1415814080000},"page":"183-187","source":"Crossref","is-referenced-by-count":1,"title":["Run-time voltage detection circuit for 3-D IC power delivery"],"prefix":"10.1109","author":[{"given":"Divya","family":"Pathak","sequence":"first","affiliation":[]},{"given":"Ioannis","family":"Savidis","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2009.10.006"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2009.2026200"},{"journal-title":"FreePDK45","year":"0","key":"13"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541535"},{"key":"11","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4614-0445-3","author":"cao","year":"2011","journal-title":"Predictive Technology Model for Robust Nanoelectronic Design"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.1998.825568"},{"journal-title":"Predictive Technology Model (PTM)","year":"0","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2012.2226378"},{"journal-title":"Characterization and Modeling OfTSV Based 3-D Integrated Circuits","year":"2013","author":"savidis","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2092110"},{"key":"7","first-page":"1","article-title":"A Cmos voltage controlled ring oscillator with improved frequency stability","volume":"2","author":"jovanovic","year":"2010","journal-title":"Ser A Appl Math Inform and Mech"},{"journal-title":"A Ring Oscillator Based Variation Test Chip","year":"2002","author":"panganiban","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/54.825679"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2012.6292062"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541436"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2013.12.008"}],"event":{"name":"2014 27th IEEE International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2014,9,2]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2014,9,5]]}},"container-title":["2014 27th IEEE International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6937053\/6948870\/06948923.pdf?arnumber=6948923","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,22]],"date-time":"2017-06-22T20:03:05Z","timestamp":1498161785000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948923\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/socc.2014.6948923","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}