{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T09:04:58Z","timestamp":1725699898378},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/socc.2014.6948962","type":"proceedings-article","created":{"date-parts":[[2014,11,12]],"date-time":"2014-11-12T17:41:20Z","timestamp":1415814080000},"page":"398-403","source":"Crossref","is-referenced-by-count":2,"title":["SoC Scan-Chain verification utilizing FPGA-based emulation platform and SCE-MI interface"],"prefix":"10.1109","author":[{"given":"Bill Jason","family":"Tomas","sequence":"first","affiliation":[]},{"given":"Yingtao","family":"Jiang","sequence":"additional","affiliation":[]},{"given":"Mei","family":"Yang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/ICCD.1990.130193"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/SOCDC.2008.4815716"},{"year":"1990","author":"abramovici","journal-title":"Digital Systems Testing and Testable Design","key":"1"},{"year":"2014","journal-title":"Riviera-PRO Functional Verification-Products","article-title":"Riviera-pro-functional verification-products - aldec","key":"7"},{"year":"2014","journal-title":"International Symposium on Circuits and Systems","article-title":"International symposium on circuits and systems | international symposium on circuits and systems","key":"6"},{"year":"2011","journal-title":"Reference Manual Ver 2 1 Accellera Interfaces Technical Committee","article-title":"Standard co-emulation modeling interface (sce-mi)","key":"5"},{"year":"2013","journal-title":"HES Verification with Tlm","article-title":"Aldec","key":"4"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/ISICir.2011.6131932"},{"year":"2014","journal-title":"HES-DVM-Emulation-Products - Aldec","article-title":"HES-dvm-emulation-products - aldec","key":"8"}],"event":{"name":"2014 27th IEEE International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2014,9,2]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2014,9,5]]}},"container-title":["2014 27th IEEE International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6937053\/6948870\/06948962.pdf?arnumber=6948962","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,24]],"date-time":"2017-03-24T00:57:02Z","timestamp":1490317022000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6948962\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/socc.2014.6948962","relation":{},"subject":[],"published":{"date-parts":[[2014,9]]}}}