{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T14:10:40Z","timestamp":1730297440439,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/socc.2018.8618524","type":"proceedings-article","created":{"date-parts":[[2019,1,22]],"date-time":"2019-01-22T07:02:38Z","timestamp":1548140558000},"page":"192-196","source":"Crossref","is-referenced-by-count":5,"title":["An Automated Fault Injection Platform for Fault Tolerant FFT Implemented in SRAM-Based FPGA"],"prefix":"10.1109","author":[{"given":"Chuang-An","family":"Mao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yu","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yizhuang","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"He","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"Multiple Fault Injection Platform for SRAM-Based FPGA Based on Ground-Level Radiation Experiments","author":"jorge","year":"2015","journal-title":"IEEE Test Symposium"},{"key":"ref11","article-title":"7 Series FPGAs Configuration","volume":"1","year":"2018","journal-title":"User Guide UG479"},{"key":"ref12","first-page":"1","article-title":"A novel low-overhead fault tolerant parallel-pipelined FFT design","author":"yu","year":"2017","journal-title":"IEEE International Symposium on Defect and Fault Tolerance in Vlsi and Nanotechnology Systems IEEE Computer Society"},{"journal-title":"Application Note XAPP538 Xilinx 2012b","article-title":"Soft Error Mitigation Using Prioritized Essential Bits","year":"0","key":"ref13"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"501","DOI":"10.1145\/1142155.1142167","article-title":"A surveyof fault tolerant methodologies for fpgas","volume":"11","author":"jason","year":"2006","journal-title":"ACM Trans Des Autom Electron Syst"},{"key":"ref3","first-page":"1","article-title":"An automated fault injection for evaluation of LUTs robustness in SRAM-based FPGAs","author":"anis","year":"2016","journal-title":"Proc of IEEE East-West Design & Test Symposium"},{"journal-title":"Low-power fault tolerance for spacecraft FPGA-based numerical computing","year":"2006","author":"snodgrass","key":"ref6"},{"journal-title":"Triple Module Redundancy Design Techniques for Virtex FPGAs","year":"2006","author":"xapp","key":"ref5"},{"key":"ref8","first-page":"1","article-title":"Flight experience of the xilinx virtex-4. Nuclear Science","author":"quinn","year":"2013","journal-title":"IEEE Transactions on PP(99)"},{"key":"ref7","first-page":"144","author":"fouad","year":"2017","journal-title":"Fast SRAM-FPGA Fault Injection Platform based On Dynamic Partial Reconfiguration"},{"key":"ref2","article-title":"Xilinx, UltraScale Devices Maximize Design Integrity with Industry-Leading SEU Resilience and Mitigation","volume":"1","year":"2015","journal-title":"White Paper WP462"},{"key":"ref1","first-page":"649","article-title":"Evaluation of SRAM based FPGA performance by simulating SEU through fault injection","author":"mohamed mahmoud","year":"2013","journal-title":"International Conference on Recent Advances in Space Technologies IEEE"},{"key":"ref9","first-page":"144","author":"fouad","year":"2017","journal-title":"Fast SRAM-FPGA Fault Injection Platform based On Dynamic Partial Reconfiguration"}],"event":{"name":"2018 31st IEEE International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2018,9,4]]},"location":"Arlington, VA","end":{"date-parts":[[2018,9,7]]}},"container-title":["2018 31st IEEE International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8600278\/8618478\/08618524.pdf?arnumber=8618524","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,27]],"date-time":"2022-01-27T00:12:11Z","timestamp":1643242331000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8618524\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/socc.2018.8618524","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}