{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T14:11:48Z","timestamp":1730297508010,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/socc46988.2019.1570557014","type":"proceedings-article","created":{"date-parts":[[2020,5,8]],"date-time":"2020-05-08T01:27:28Z","timestamp":1588901248000},"page":"109-112","source":"Crossref","is-referenced-by-count":1,"title":["An All-Digital Temperature Sensor with Process and Voltage Variation Tolerance for IoT Applications"],"prefix":"10.1109","author":[{"given":"Ching-Che","family":"Chung","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hsin-Han","family":"Huang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2144290"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2016.7428021"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"1590","DOI":"10.1109\/TVLSI.2011.2161783","article-title":"Time-domain CMOS temperature sensors with dual delay-locked loops for microprocessor thermal monitoring","volume":"20","author":"dongwan","year":"2012","journal-title":"IEEE Trans Very Large Scale Integration (VLSI) Systems"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC.2014.6948931"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3906\/elk-1510-174"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"1615","DOI":"10.1109\/TVLSI.2011.2160301","article-title":"A low voltage all-digital on-chip oscillator ising relative reference modeling","volume":"20","author":"yu","year":"2012","journal-title":"IEEETrans Very Large Scale Integration (VLSI) Systems"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2016.7479819"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2016.7604818"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2017.2735447"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852041"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2000424"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050415"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2344112"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2015.7388608"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2623744"},{"key":"ref2","first-page":"1","article-title":"A 113pW fully integrated CMOS temperature sensor operation at 0.5V","author":"wang","year":"2017","journal-title":"in Proc IEEE Sensors"},{"key":"ref1","first-page":"222","article-title":"A 80kS36 ?W resistor-based temperature sensor using BGR-free SAR ADC with a unevenly-weighted resistor string in 0.18 ?m CMOS","author":"wu","year":"2011","journal-title":"Proceedings of the Symposium on VLSI Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2598765"}],"event":{"name":"2019 32nd IEEE International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2019,9,3]]},"location":"Singapore","end":{"date-parts":[[2019,9,6]]}},"container-title":["2019 32nd IEEE International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9083732\/9087941\/09088057.pdf?arnumber=9088057","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:11:36Z","timestamp":1657854696000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9088057\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/socc46988.2019.1570557014","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}