{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,28]],"date-time":"2025-11-28T17:00:56Z","timestamp":1764349256004,"version":"3.37.3"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,9,14]],"date-time":"2021-09-14T00:00:00Z","timestamp":1631577600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,14]],"date-time":"2021-09-14T00:00:00Z","timestamp":1631577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,14]],"date-time":"2021-09-14T00:00:00Z","timestamp":1631577600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003819","name":"Natural Science Foundation of Hubei Province","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003819","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,9,14]]},"DOI":"10.1109\/socc52499.2021.9739555","type":"proceedings-article","created":{"date-parts":[[2022,3,24]],"date-time":"2022-03-24T21:59:13Z","timestamp":1648159153000},"page":"170-175","source":"Crossref","is-referenced-by-count":3,"title":["Identifying Specious LUTs for Satisfiability Don\u2019t Care Trojan Detection"],"prefix":"10.1109","author":[{"given":"Lingjuan","family":"Wu","sequence":"first","affiliation":[{"name":"Huazhong Agricultural University,College of Informatics,Wuhan,China,430070"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuefei","family":"Li","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiacheng","family":"Zhu","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jian","family":"Zheng","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Hu","sequence":"additional","affiliation":[{"name":"Northwestern Polytechnical University,School of Cybersecurity,Xi’an,China,710072"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2508859.2516654"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2422836"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2016.225"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2019.8714906"},{"key":"ref14","first-page":"707","article-title":"Why you should care about don’t cares: Exploiting internal don’t care conditions for hardware Trojans","author":"hu","year":"2017","journal-title":"IEEE\/ACM International Conference on Computer-Aided Design"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/FPL50879.2020.00039"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2013.2249555"},{"key":"ref17","first-page":"35","article-title":"Design and detection of hardware Trojans based on satisfiability don’t cares","volume":"7","author":"wu","year":"2021","journal-title":"Chinese Journal of Network and Information Security"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2011.32"},{"key":"ref19","first-page":"1","article-title":"Hardware Trojans hidden in RTL don’t cares—automated insertion and prevention methodologies","author":"fern","year":"2015","journal-title":"IEEE International Test Conference (ITC)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3074549"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-33027-8_2"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2018.8624866"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3229050"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2727985"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2017.2763088"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_12"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.2008.4505310"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SP.2010.18"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7927266"}],"event":{"name":"2021 IEEE 34th International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2021,9,14]]},"location":"Las Vegas, NV, USA","end":{"date-parts":[[2021,9,17]]}},"container-title":["2021 IEEE 34th International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9739206\/9739211\/09739555.pdf?arnumber=9739555","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:21:53Z","timestamp":1657333313000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9739555\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9,14]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/socc52499.2021.9739555","relation":{},"subject":[],"published":{"date-parts":[[2021,9,14]]}}}