{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,24]],"date-time":"2025-10-24T08:33:15Z","timestamp":1761294795218,"version":"3.29.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,9,16]],"date-time":"2024-09-16T00:00:00Z","timestamp":1726444800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,16]],"date-time":"2024-09-16T00:00:00Z","timestamp":1726444800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,9,16]]},"DOI":"10.1109\/socc62300.2024.10737721","type":"proceedings-article","created":{"date-parts":[[2024,11,5]],"date-time":"2024-11-05T18:29:41Z","timestamp":1730831381000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Analog Circuits Fault Diagnosis Based on Machine Learning"],"prefix":"10.1109","author":[{"given":"Huapei","family":"Wang","sequence":"first","affiliation":[{"name":"Shanghai Dianji University,School of Electronic information Engineering,Shanghai,China"}]},{"given":"Cheng","family":"Cai","sequence":"additional","affiliation":[{"name":"Shanghai Dianji University,School of Electronic information Engineering,Shanghai,China"}]},{"given":"Xuxin","family":"Chen","sequence":"additional","affiliation":[{"name":"Shanghai Dianji University,School of Electronic information Engineering,Shanghai,China"}]},{"given":"Fang","family":"Huo","sequence":"additional","affiliation":[{"name":"UNISOC(Shanghai)Technologies Co.,Ltd,Manufacturing Business Division,Shanghai,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/yac.2017.7967546"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/emes.2019.8795202"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/date.2010.5457099"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICDV61346.2024.10616633"},{"key":"ref5","article-title":"The State-of-the-Art of Fault Diagnosis of Analog Circuits and Its Prospect","author":"He","year":"2004","journal-title":"Microelectronics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/icaice51518.2020.00081"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2013.6555452"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ciycee53554.2021.9676938"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ATS59501.2023.10317956"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNEA50255.2020.00071"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCTIS51085.2021.00022"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/icpet59380.2023.10367476"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2021.3076282"}],"event":{"name":"2024 IEEE 37th International System-on-Chip Conference (SOCC)","start":{"date-parts":[[2024,9,16]]},"location":"Dresden, Germany","end":{"date-parts":[[2024,9,19]]}},"container-title":["2024 IEEE 37th International System-on-Chip Conference (SOCC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10737725\/10737709\/10737721.pdf?arnumber=10737721","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,27]],"date-time":"2024-11-27T13:53:42Z","timestamp":1732715622000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10737721\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9,16]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/socc62300.2024.10737721","relation":{},"subject":[],"published":{"date-parts":[[2024,9,16]]}}}