{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T14:24:39Z","timestamp":1730298279484,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,7]]},"DOI":"10.1109\/spcom.2018.8724436","type":"proceedings-article","created":{"date-parts":[[2019,5,30]],"date-time":"2019-05-30T18:48:36Z","timestamp":1559242116000},"page":"272-276","source":"Crossref","is-referenced-by-count":0,"title":["Time-domain Complexity Analysis of Impulse Noise Sources for xDSL\/PLC Systems"],"prefix":"10.1109","author":[{"given":"Neelima","family":"Singh","sequence":"first","affiliation":[]},{"given":"Brejesh","family":"Lall","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.cmpb.2005.06.011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1201\/b11408"},{"key":"ref12","doi-asserted-by":"crossref","DOI":"10.1142\/3292","volume":"22","author":"ogorzaek","year":"1997","journal-title":"Chaos and Complexity in Nonlinear Electronic Circuits"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1201\/9780203494554"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1152\/ajpheart.2000.278.6.H2039"},{"key":"ref4","article-title":"Novel approach for PLC impulse noise modeling","author":"tlich","year":"2009","journal-title":"Proc IEEE-ISPLC"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISPLC.2012.6201291"},{"key":"ref6","article-title":"Randomness and degrees of irregularity","author":"pincus","year":"1995","journal-title":"Proceedings National Academy of Science"},{"journal-title":"ETSI VDSL2 should also withstand \"PEIN\" impulse noise","year":"0","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.88.6.2297"},{"journal-title":"A survey of complexity measures","year":"1998","author":"feldman","key":"ref7"},{"journal-title":"Test procedures for digital subscriber line (DSL) transceivers","year":"0","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC2.2003.1428221"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/15.30920"}],"event":{"name":"2018 International Conference on Signal Processing and Communications (SPCOM)","start":{"date-parts":[[2018,7,16]]},"location":"Bangalore, India","end":{"date-parts":[[2018,7,19]]}},"container-title":["2018 International Conference on Signal Processing and Communications (SPCOM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8718087\/8724385\/08724436.pdf?arnumber=8724436","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,25]],"date-time":"2019-06-25T14:44:00Z","timestamp":1561473840000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8724436\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/spcom.2018.8724436","relation":{},"subject":[],"published":{"date-parts":[[2018,7]]}}}