{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T03:26:45Z","timestamp":1725593205461},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,3,1]],"date-time":"2019-03-01T00:00:00Z","timestamp":1551398400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,3]]},"DOI":"10.1109\/ssd.2019.8893166","type":"proceedings-article","created":{"date-parts":[[2019,11,13]],"date-time":"2019-11-13T09:32:11Z","timestamp":1573637531000},"page":"145-148","source":"Crossref","is-referenced-by-count":0,"title":["Modeling and FEM Verification of Surface-Roughness Effect on the Static Response of RF-MEMS Switches"],"prefix":"10.1109","author":[{"given":"Hamid","family":"Nawaz","sequence":"first","affiliation":[]},{"given":"Muhammad Mubasher","family":"Saleem","sequence":"additional","affiliation":[]},{"given":"Muhammad Umar","family":"Masood","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.60.9157"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/15\/5\/025"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2004.01.010"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/mop.22903"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.361242"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.56.7726"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.2363745"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/16\/10\/032"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1984.0050"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/22\/11\/115023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.07.072"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2007.904744"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2005.845689"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/12\/4\/319"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/25\/5\/055007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/10\/4\/201"},{"journal-title":"RF MEMS Theory Design and Technology","year":"2004","author":"rebeiz","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SENSOR.2003.1217118"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2002.1175982"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1115\/1.2910594"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2009.2024796"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s100510050219"}],"event":{"name":"2019 16th International Multi-Conference on Systems, Signals & Devices (SSD)","start":{"date-parts":[[2019,3,21]]},"location":"Istanbul, Turkey","end":{"date-parts":[[2019,3,24]]}},"container-title":["2019 16th International Multi-Conference on Systems, Signals & Devices (SSD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8885406\/8893147\/08893166.pdf?arnumber=8893166","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,17]],"date-time":"2022-07-17T21:50:16Z","timestamp":1658094616000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8893166\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,3]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/ssd.2019.8893166","relation":{},"subject":[],"published":{"date-parts":[[2019,3]]}}}