{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,4]],"date-time":"2026-05-04T07:13:29Z","timestamp":1777878809340,"version":"3.51.4"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,6]],"date-time":"2022-05-06T00:00:00Z","timestamp":1651795200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,6]],"date-time":"2022-05-06T00:00:00Z","timestamp":1651795200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,6]]},"DOI":"10.1109\/ssd54932.2022.9955675","type":"proceedings-article","created":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T15:17:20Z","timestamp":1669648640000},"page":"92-96","source":"Crossref","is-referenced-by-count":4,"title":["A technique for diagnosing short-circuit and open-circuit faults of the three-phase inverter"],"prefix":"10.1109","author":[{"given":"Chakib","family":"Drif","sequence":"first","affiliation":[{"name":"University of Setif1,LAS-Department of Electrical Engineering,Algeria"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdenour","family":"Soualhi","sequence":"additional","affiliation":[{"name":"Roanne University of Saint Etienne,Laboratory LASP1,France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hamou","family":"Nouri","sequence":"additional","affiliation":[{"name":"University of Setif1,LAS-Department of Electrical Engineering,Algeria"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Artificial Neural Network Approach Assessment of Short-Circuit Fault Detection in a Three Phase Inverter","author":"mimouna","year":"2021","journal-title":"International Congress of Advanced Technology and Engineering (ICOTEN)"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2052472"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.809351"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2924487"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2011.5984487"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8912813"},{"key":"ref16","author":"azzedinne","year":"2021","journal-title":"Réalisation d'un Onduleur de Tension Commandé par Microcontrôleur pour un Système Photovoltaïque"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/08IAS.2008.349"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PESTSE.2016.7516413"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2114313"},{"key":"ref3","author":"vallon","year":"2003","journal-title":"Introduction à I'étude de la fiabilité des cellules de commutation à IGBT sous fortes contraintes"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098355"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(02)00042-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.1999.769220"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2005.219426"},{"key":"ref2","author":"maamouri","year":"2017","journal-title":"Diagnostic et Commande Tolérante aux Défauts Appliqués à un Système de Conversion Électromécanique à Base d'une Machine Asynchrone Triphasée"},{"key":"ref1","first-page":"65","article-title":"2Elintraînements électriques, automatisation et processus électriques2","author":"jufer","year":"1996","journal-title":"RAVEL Lausanne"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"538","DOI":"10.1049\/cp:19980607","article-title":"voltage source inverter fault diagnosis in variable speed ac drives, by park's vector approach","author":"mendes","year":"1998","journal-title":"Seventh International Conference on Power Electronics and Variable Speed Drives (IEE Conf Publ No 456)"}],"event":{"name":"2022 19th International Multi-Conference on Systems, Signals & Devices (SSD)","location":"S\u00e9tif, Algeria","start":{"date-parts":[[2022,5,6]]},"end":{"date-parts":[[2022,5,10]]}},"container-title":["2022 19th International Multi-Conference on Systems, Signals & Devices (SSD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9955493\/9955494\/09955675.pdf?arnumber=9955675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,19]],"date-time":"2022-12-19T15:07:08Z","timestamp":1671462428000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9955675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,6]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/ssd54932.2022.9955675","relation":{},"subject":[],"published":{"date-parts":[[2022,5,6]]}}}