{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,15]],"date-time":"2026-01-15T02:04:02Z","timestamp":1768442642290,"version":"3.49.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,2,20]],"date-time":"2023-02-20T00:00:00Z","timestamp":1676851200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,20]],"date-time":"2023-02-20T00:00:00Z","timestamp":1676851200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,2,20]]},"DOI":"10.1109\/ssd58187.2023.10411225","type":"proceedings-article","created":{"date-parts":[[2024,2,6]],"date-time":"2024-02-06T18:46:57Z","timestamp":1707245217000},"page":"209-212","source":"Crossref","is-referenced-by-count":1,"title":["Fabrication and characterization of Ti\/TiN- based resistance temperature detector"],"prefix":"10.1109","author":[{"given":"Walid","family":"Filali","sequence":"first","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hadjira","family":"Haridi","sequence":"additional","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Elyes","family":"Garoudja","sequence":"additional","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Boubaaya","sequence":"additional","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abdelkrim","family":"El Hadi Khediri","sequence":"additional","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mohamed","family":"Mekheldi","sequence":"additional","affiliation":[{"name":"Centre de Développement Des Technologies Avancées,Plateforme Technologique de Microfabrication,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laid","family":"Henni","sequence":"additional","affiliation":[{"name":"Centre de Développement des Technologies Avancées,Division Milieux Ionisés et Laser,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fouaz","family":"Lekoui","sequence":"additional","affiliation":[{"name":"Centre de Développement des Technologies Avancées,Division Milieux Ionisés et Laser,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rouabeh","family":"Hamza","sequence":"additional","affiliation":[{"name":"Université Batna 2,Faculté de Technologie Rue Chahid Boukhlouf M. El Hadi,Département Electronique,Batna,Algérie,05001"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rachid","family":"Amrani","sequence":"additional","affiliation":[{"name":"Université Benyoucef Benkhedda,Département Des Sciences de la Matière,Algiers,Algeria"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Slimane","family":"Oussalah","sequence":"additional","affiliation":[{"name":"Centre de Développement des Technologies Avancées,Division Microélectronique et Nanotechnologies,Algiers,Algeria,16081"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/714037708"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1201\/9781315220482","volume-title":"Microelectronics","author":"Whitaker","year":"2018"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/bltj.2084"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.4916540"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/admi.201600026"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.01.014"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2036573"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1149\/2.022301jss"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.04.040"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00216-014-8222-9"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.14257\/ijca.2015.8.8.08"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2006.07.019"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2018.09.062"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2012.6471381"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/0471749095"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1117\/12.361232"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/21\/12\/125021"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2007.908437"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.884167"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1186\/1556-276X-7-673"}],"event":{"name":"2023 20th International Multi-Conference on Systems, Signals & Devices (SSD)","location":"Mahdia, Tunisia","start":{"date-parts":[[2023,2,20]]},"end":{"date-parts":[[2023,2,23]]}},"container-title":["2023 20th International Multi-Conference on Systems, Signals & Devices (SSD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10411147\/10411148\/10411225.pdf?arnumber=10411225","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T08:33:32Z","timestamp":1709454812000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10411225\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,20]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ssd58187.2023.10411225","relation":{},"subject":[],"published":{"date-parts":[[2023,2,20]]}}}