{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:40:09Z","timestamp":1747809609171,"version":"3.41.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,2,17]],"date-time":"2025-02-17T00:00:00Z","timestamp":1739750400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,17]],"date-time":"2025-02-17T00:00:00Z","timestamp":1739750400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,2,17]]},"DOI":"10.1109\/ssd64182.2025.10989885","type":"proceedings-article","created":{"date-parts":[[2025,5,20]],"date-time":"2025-05-20T17:05:31Z","timestamp":1747760731000},"page":"1315-1321","source":"Crossref","is-referenced-by-count":0,"title":["Optimized Measurement Methods Evaluating Crosstalk in different SOI Technologies"],"prefix":"10.1109","author":[{"given":"Bjoern","family":"Bieske","sequence":"first","affiliation":[{"name":"IMMS Institut für Mikroelektronik-und Mechatronik-Systeme gemeinnützige GmbH (IMMS GmbH),Ilmenau,Germany"}]},{"given":"Dagmar","family":"Kirsten","sequence":"additional","affiliation":[{"name":"X-FAB Global Services GmbH,Erfurt,Germany"}]},{"given":"Michael","family":"Frey","sequence":"additional","affiliation":[{"name":"Melexis GmbH,Erfurt,Germany"}]},{"given":"Andreas","family":"Ott","sequence":"additional","affiliation":[{"name":"Melexis GmbH,Erfurt,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/b106472"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.852736"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058792"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/16.644646"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.822348"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDER.2005.1546628"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ectc.2004.1320316"},{"key":"ref9","first-page":"107","article-title":"New substrate-crosstalk reduction structure using SO1 substrate","volume-title":"Proc. IEEE Int. SO1 Conf","author":"Hiraoka"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2001.979559"},{"volume-title":"Checklist For Successful S-Parameter Measurements","author":"Sischka","key":"ref12"},{"journal-title":"Pr\u00e4sentation Melexis","article-title":"Validation test chips XP018 \/XT018 TC947\/948 \u2013 Crosstalk","author":"Ott","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2011.2170074"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2013.2279677"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MEMC.2024.10834403"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/icicdt63592.2024.10717649"}],"event":{"name":"2025 IEEE 22nd International Multi-Conference on Systems, Signals & Devices (SSD)","start":{"date-parts":[[2025,2,17]]},"location":"Monastir, Tunisia","end":{"date-parts":[[2025,2,20]]}},"container-title":["2025 IEEE 22nd International Multi-Conference on Systems, Signals & Devices (SSD)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10989785\/10989811\/10989885.pdf?arnumber=10989885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:04:09Z","timestamp":1747807449000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10989885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2,17]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ssd64182.2025.10989885","relation":{},"subject":[],"published":{"date-parts":[[2025,2,17]]}}}