{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:38:01Z","timestamp":1729618681684,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/ssp.2012.6319791","type":"proceedings-article","created":{"date-parts":[[2013,5,15]],"date-time":"2013-05-15T21:02:02Z","timestamp":1368651722000},"page":"672-675","source":"Crossref","is-referenced-by-count":2,"title":["Application of FIB\/SEM\/EDXS tomographic spectral imaging and multivariate statistical analysis to the analysis of localized corrosion"],"prefix":"10.1109","author":[{"given":"Paul G.","family":"Kotula","sequence":"first","affiliation":[]},{"given":"Mark H.","family":"Van Benthem","sequence":"additional","affiliation":[]},{"given":"N. Rob","family":"Sorensen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1002\/sia.2949"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1002\/9780470010884.ch5"},{"key":"1","first-page":"36","volume":"12","author":"kotula","year":"2006","journal-title":"Tomographic Spectral Imaging with Multivariate Statistical Analysis Comprehensive 3D Microanalys"},{"journal-title":"Method of Multivariate Spectral Analysis","year":"2004","author":"keenan","key":"7"},{"journal-title":"Apparatus and system for multivariate spectral analysis","year":"2003","author":"keenan","key":"6"},{"key":"5","doi-asserted-by":"crossref","first-page":"203","DOI":"10.1002\/sia.1657","article-title":"Accounting noise in the multivariate statistical analysis of TOF-SIMS data","volume":"36","author":"keenan","year":"2004","journal-title":"Surf Int Anal"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.apsusc.2004.03.025"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927603030058"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927604880620"}],"event":{"name":"2012 IEEE Statistical Signal Processing Workshop (SSP)","start":{"date-parts":[[2012,8,5]]},"location":"Ann Arbor, MI, USA","end":{"date-parts":[[2012,8,8]]}},"container-title":["2012 IEEE Statistical Signal Processing Workshop (SSP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6310431\/6319629\/06319791.pdf?arnumber=6319791","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T13:07:24Z","timestamp":1498050444000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6319791\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ssp.2012.6319791","relation":{},"subject":[],"published":{"date-parts":[[2012,8]]}}}