{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,18]],"date-time":"2026-04-18T10:06:46Z","timestamp":1776506806081,"version":"3.51.2"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,4,17]],"date-time":"2023-04-17T00:00:00Z","timestamp":1681689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,4,17]],"date-time":"2023-04-17T00:00:00Z","timestamp":1681689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,4,17]]},"DOI":"10.1109\/syscon53073.2023.10131138","type":"proceedings-article","created":{"date-parts":[[2023,5,25]],"date-time":"2023-05-25T17:29:09Z","timestamp":1685035749000},"page":"1-7","source":"Crossref","is-referenced-by-count":6,"title":["Ensemble Method For Fault Detection & Classification in Transmission Lines Using ML"],"prefix":"10.1109","author":[{"given":"Muhammad Hayyan","family":"Bin Shahid","sequence":"first","affiliation":[{"name":"Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Akramul","family":"Azim","sequence":"additional","affiliation":[{"name":"Ontario Tech University,Dept. Of Electrical, Computer, and Software Engineering,Ontario,Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2016.0005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s12667-014-0129-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jesit.2017.01.004"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-017-3295-y"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICASTECH.2018.8506774"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2278272"},{"key":"ref22","article-title":"Electrical-Fault-detection-and-classification","author":"arthur","year":"2021"},{"key":"ref10","year":"0","journal-title":"A Comparison of Different Mother_4"},{"key":"ref21","article-title":"Detection and classification of short-circuit faults on a transmission line using current signal","volume":"69","author":"coban","year":"2021","journal-title":"Bulletin of the Polish Academy of Sciences Technical Sciences"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2273292"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PESW.2000.847630"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2016.0005"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jesit.2016.10.003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2543145"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2211898"},{"key":"ref8","article-title":"Compact Support Biorthogonal Wavelet Filterbanks for Arbitrary Undirected Graphs","author":"narang","year":"2012"},{"key":"ref7","author":"chavan","year":"2011","journal-title":"Implementation of SYMLET wavelets to removal of Gaussian additive noise from speech signal Analysis and Synthesis of perturbed Duffing oscillators’ View project Optimal software quality management tools design View project Implementation of SYMLET Wavelets to Removal of Gaussian Additive Noise from Speech Signal"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1515\/aoa-2015-0035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2050911"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2053222"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.4871876"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/app9071345"}],"event":{"name":"2023 IEEE International Systems Conference (SysCon)","location":"Vancouver, BC, Canada","start":{"date-parts":[[2023,4,17]]},"end":{"date-parts":[[2023,4,20]]}},"container-title":["2023 IEEE International Systems Conference (SysCon)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10131045\/10131046\/10131138.pdf?arnumber=10131138","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,12]],"date-time":"2023-06-12T17:55:57Z","timestamp":1686592557000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10131138\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,4,17]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/syscon53073.2023.10131138","relation":{},"subject":[],"published":{"date-parts":[[2023,4,17]]}}}