{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,15]],"date-time":"2026-03-15T14:24:57Z","timestamp":1773584697979,"version":"3.50.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T00:00:00Z","timestamp":1743984000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,4,7]],"date-time":"2025-04-07T00:00:00Z","timestamp":1743984000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,4,7]]},"DOI":"10.1109\/syscon64521.2025.11014839","type":"proceedings-article","created":{"date-parts":[[2025,5,30]],"date-time":"2025-05-30T17:43:30Z","timestamp":1748627010000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["Optimizing Wind Power Integration in Microgrids via Dynamic Line Rating and EV Scheduling: A Coordinated Approach"],"prefix":"10.1109","author":[{"given":"Tianhua","family":"Song","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM),Penang,Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiashen","family":"Teh","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Engineering Campus, Universiti Sains Malaysia (USM),Penang,Malaysia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ching-Ming","family":"Lai","sequence":"additional","affiliation":[{"name":"National Chung Hsing University,Department of Electrical Engineering,Taichung,Taiwan"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3153634"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.28991\/esj-2023-07-03-02"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.28991\/cej-2022-08-11-018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tsg.2014.2385711"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tia.2014.2367102"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2574799"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2009.2016598"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrs.2015.2411332"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2008.921556"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2017.11.061"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.35833\/mpce.2022.000424"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tits.2023.3314571"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2012.2205398"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.02.008"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.09.078"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2017.2740158"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tr.2018.2837114"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2019.2921952"},{"key":"ref19","article-title":"IEEE Power and Energy Society, IEEE Std","volume-title":"738 standard for calculating the current-temperature relationship of bare overhead conductors","year":"2012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.segan.2019.100268"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2023.109726"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.01.089"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2014.2299068"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tec.2007.914171"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tsp.2013.2288675"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.108643"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108185"}],"event":{"name":"2025 IEEE International systems Conference (SysCon)","location":"Montreal, QC, Canada","start":{"date-parts":[[2025,4,7]]},"end":{"date-parts":[[2025,4,10]]}},"container-title":["2025 IEEE International systems Conference (SysCon)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11014641\/11014642\/11014839.pdf?arnumber=11014839","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,31]],"date-time":"2025-05-31T05:00:00Z","timestamp":1748667600000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11014839\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,4,7]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/syscon64521.2025.11014839","relation":{},"subject":[],"published":{"date-parts":[[2025,4,7]]}}}