{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T06:34:31Z","timestamp":1765262071920,"version":"3.46.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Aerosp. Electron. Syst."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/taes.2025.3592918","type":"journal-article","created":{"date-parts":[[2025,7,25]],"date-time":"2025-07-25T17:58:42Z","timestamp":1753466322000},"page":"16133-16150","source":"Crossref","is-referenced-by-count":0,"title":["Interrupted Sampling Repeater Jamming Suppression via Mismatch Filter Constructed by Multifrequency Compensation"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-1440-0261","authenticated-orcid":false,"given":"Yipin","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2404-3035","authenticated-orcid":false,"given":"Lei","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8844-7576","authenticated-orcid":false,"given":"Yinsheng","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2003.1207279"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rsn.2014.0242"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2024.109652"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2013.6494414"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2017.2670958"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2925004"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2897363"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3014650"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/mcom.2017.1700220"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2024.104416"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/rsn2.12465"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2022.103652"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/rs15143673"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2024.104418"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/lsp.2020.3021667"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/lgrs.2022.3156164"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3131491"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2022.103755"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2023.3334255"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/6759169"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rsn.2018.5658"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/ell2.12778"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2025.104985"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2025.105132"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rsn.2017.0114"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3159561"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2021.3068443"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2023.104059"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1049\/rsn2.12568"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2024.104850"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2022.108596"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2022.103546"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/taes.2023.3297559"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3271116"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tsp.2024.3390119"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3278709"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2020.102806"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2024.3492334"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2025.105289"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.3390\/s23125619"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1142\/s0129065700000028"}],"container-title":["IEEE Transactions on Aerospace and Electronic Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7\/11283081\/11097040.pdf?arnumber=11097040","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T06:18:52Z","timestamp":1765261132000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11097040\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":41,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/taes.2025.3592918","relation":{},"ISSN":["0018-9251","1557-9603","2371-9877"],"issn-type":[{"type":"print","value":"0018-9251"},{"type":"electronic","value":"1557-9603"},{"type":"electronic","value":"2371-9877"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}