{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T05:10:53Z","timestamp":1780636253478,"version":"3.54.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,12,1]],"date-time":"2025-12-01T00:00:00Z","timestamp":1764547200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Aerosp. Electron. Syst."],"published-print":{"date-parts":[[2025,12]]},"DOI":"10.1109\/taes.2025.3599136","type":"journal-article","created":{"date-parts":[[2025,8,14]],"date-time":"2025-08-14T18:49:20Z","timestamp":1755197360000},"page":"16981-16992","source":"Crossref","is-referenced-by-count":3,"title":["Nonvolatile Double- and Triple-Node-Upset Tolerant Latch Designs Based on FeFET and CMOS"],"prefix":"10.1109","volume":"61","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0024-987X","authenticated-orcid":false,"given":"Aibin","family":"Yan","sequence":"first","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Biying","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Wangjin","family":"Jiang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6272-8660","authenticated-orcid":false,"given":"Tianming","family":"Ni","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Anhui Polytechnic University, Wuhu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8695-4478","authenticated-orcid":false,"given":"Zhengfeng","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Microelectronics, Hefei University of Technology, Hefei, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0722-8772","authenticated-orcid":false,"given":"Patrick","family":"Girard","sequence":"additional","affiliation":[{"name":"Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) Lab, UMR 5506, University of Montpellier/French National Center for Scientific Research (CNRS), Montpellier, France"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8305-604X","authenticated-orcid":false,"given":"Xiaoqing","family":"Wen","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Networks, Kyushu Institute of Technology, Fukuoka, Japan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2025.3541213"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3638765"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISLPED.2019.8824948"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2022.3158822"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.3033229"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1166\/jno.2018.2365"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1149\/2162-8777\/ac77bb"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2024.3460809"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2022.154452"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3399223"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3111913"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IMW48823.2020.9108150"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAT.2024.3423665"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3095036"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2022.3153795"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2023.3344710"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3061721"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2829348"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ATS59501.2023.10318017"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218704"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10558033"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.23919\/DATE64628.2025.10993239"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/el.2015.3020"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DFT52944.2021.9568359"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.4374"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3110135"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2023.3324006"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3274632"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2776285"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2018.2871861"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2025.3535926"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3118645"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1063\/1.3634072"},{"issue":"1","key":"ref34","first-page":"1","article-title":"Landau-Khalatnikov simulations for ferroelectric switching in ferroelectric random access memory application","volume":"46","author":"Song","year":"2005","journal-title":"J. Korean Phys. Soc."},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2702741"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2558149"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2449073"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.2966200"}],"container-title":["IEEE Transactions on Aerospace and Electronic Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7\/11283081\/11125891.pdf?arnumber=11125891","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T06:16:51Z","timestamp":1765261011000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11125891\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,12]]},"references-count":38,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/taes.2025.3599136","relation":{},"ISSN":["0018-9251","1557-9603","2371-9877"],"issn-type":[{"value":"0018-9251","type":"print"},{"value":"1557-9603","type":"electronic"},{"value":"2371-9877","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,12]]}}}