{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T20:58:47Z","timestamp":1775509127764,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Qatar Research Development and Innovation Council","award":["NPRP14C-0909-210008"],"award-info":[{"award-number":["NPRP14C-0909-210008"]}]},{"DOI":"10.13039\/100019687","name":"Hamad Bin Khalifa University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100019687","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Aerosp. Electron. Syst."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/taes.2026.3657736","type":"journal-article","created":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T06:06:32Z","timestamp":1769493992000},"page":"5167-5182","source":"Crossref","is-referenced-by-count":0,"title":["Secure Sum-Rate Optimization in RIS-Assisted RSMA HAP Systems With Untrusted Users"],"prefix":"10.1109","volume":"62","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1880-8046","authenticated-orcid":false,"given":"Zain","family":"Ali","sequence":"first","affiliation":[{"name":"College of Science and Engineering, Hamad Bin Khalifa University, Doha, Qatar"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5017-5007","authenticated-orcid":false,"given":"Saud","family":"Althunibat","sequence":"additional","affiliation":[{"name":"Department of Communications Engineering, King Abdullah II School of Engineering, Princess Sumaya University for Technology, Amman, Jordan"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3088-6899","authenticated-orcid":false,"given":"Mazen Omar","family":"Hasna","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Qatar University, Doha, Qatar"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0766-9212","authenticated-orcid":false,"given":"Khalid","family":"Qaraqe","sequence":"additional","affiliation":[{"name":"College of Science and Engineering, Hamad Bin Khalifa University, Doha, Qatar"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2023.3247920"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2010.5505950"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMLCN.2024.3491054"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2024.3508872"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2024.3394214"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3420718"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2024.3459084"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2025.3543240"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2023.3235349"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWC.001.2400371"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSC.2024.3376240"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2024.3367891"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2021.3091133"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2024.3486673"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2023.3274550"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2021.3051603"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2024.3465375"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2022.3223441"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2022.3155711"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2023.3270907"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2024.3370618"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2024.3468298"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2016.2607705"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2024.3451508"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2025.3560638"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LWC.2023.3325066"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/GLOBECOM52923.2024.10901268"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/WCNC51071.2022.9771854"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2022.3223961"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TGCN.2024.3466469"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2023.3254541"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2021.3049685"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2024.3364829"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2025.3528929"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2025.3545702"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611971453"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2020.3028875"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/twc.2025.3604003"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/tgcn.2025.3551395"}],"container-title":["IEEE Transactions on Aerospace and Electronic Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7\/11316225\/11363370.pdf?arnumber=11363370","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,6]],"date-time":"2026-04-06T19:58:39Z","timestamp":1775505519000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11363370\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/taes.2026.3657736","relation":{},"ISSN":["0018-9251","1557-9603","2371-9877"],"issn-type":[{"value":"0018-9251","type":"print"},{"value":"1557-9603","type":"electronic"},{"value":"2371-9877","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}