{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,3]],"date-time":"2026-05-03T06:02:30Z","timestamp":1777788150664,"version":"3.51.4"},"reference-count":69,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62576222"],"award-info":[{"award-number":["62576222"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006066","name":"Department of Industrial and Systems Engineering, Hong Kong Polytechnic University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100006066","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Aerosp. Electron. Syst."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/taes.2026.3665850","type":"journal-article","created":{"date-parts":[[2026,2,17]],"date-time":"2026-02-17T21:10:52Z","timestamp":1771362652000},"page":"6607-6623","source":"Crossref","is-referenced-by-count":0,"title":["Bridging Weibull Failure Models and CTMC Verification: Automated Phase-Type Encoding for Satellite Reliability Analysis in PRISM"],"prefix":"10.1109","volume":"62","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8600-1105","authenticated-orcid":false,"given":"Kelvin K.L.","family":"Wong","sequence":"first","affiliation":[{"name":"School of Artificial Intelligence, Shenzhen Technology University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7799-9794","authenticated-orcid":false,"given":"Yu","family":"Lu","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Shenzhen Technology University, Shenzhen, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6609-0713","authenticated-orcid":false,"given":"Wai Hung","family":"Ip","sequence":"additional","affiliation":[{"name":"Department of Industrial and Systems Engineering, The Hong Kong Polytechnic University, Hong Kong"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7973-8769","authenticated-orcid":false,"given":"Wenjun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Mechanical Engineering, University of Saskatchewan, Saskatoon, SK, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1909-4946","authenticated-orcid":false,"given":"Zhili","family":"Sun","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, University of Surrey, Surrey, U.K."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2017.2651598"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2668065"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMC.2017.2732343"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2009.05.004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0166-5316(97)00003-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0817"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2611576"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2573584"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2017.2667898"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2736061"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2791537"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.110419"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44804-7_4"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-44618-4_11"},{"key":"ref15","article-title":"Reliability modelling of disk subsystems with probabilistic model checking","author":"Gopinath","year":"2009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/QEST.2011.23"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/math11020302"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1002\/smr.2329"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-45943-1_6"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/203091.203094"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2003.817443"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2025.111634"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICSRS59833.2023.10381447"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10270-024-01197-7"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.107939"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109813"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2013.6497352"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-018-1009-8"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS51457.2022.9893959"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.123178"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.2514\/1.A35971"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.2514\/6.2023-72153"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2009.11.001"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.jocs.2013.06.003"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.actaastro.2016.07.021"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2018.03.044"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.106889"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2021.108050"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108471"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2024.3428934"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.actaastro.2010.07.011"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.07.020"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1754"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/SEAA64295.2024.00014"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2025.112610"},{"key":"ref46","article-title":"Goes-t launch countdown calendar","author":"Gorman","year":"2022"},{"key":"ref47","first-page":"65","article-title":"Continuous-time Markov chains","volume-title":"Optimization and Games for Controllable Markov Chains: Numerical Methods With Application to Finance and Engineering","author":"Clempner","year":"2023"},{"key":"ref48","volume-title":"Principles of Model Checking","author":"Baier","year":"2008"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1093\/oso\/9780195064650.001.0001"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2161094"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2011.11.002"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2020.3027716"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1002\/int.22328"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2024.3357776"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.124341"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1038\/s43586-021-00017-2"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1007\/s10009-004-0140-2"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1016\/j.tcs.2017.01.015"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008739929481"},{"key":"ref60","doi-asserted-by":"publisher","DOI":"10.1145\/1530873.1530882"},{"key":"ref61","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-72522-0_6"},{"key":"ref62","doi-asserted-by":"publisher","DOI":"10.1145\/343369.343402"},{"key":"ref63","doi-asserted-by":"publisher","DOI":"10.1115\/1.4010337"},{"key":"ref64","doi-asserted-by":"publisher","DOI":"10.1080\/15326349308807278"},{"key":"ref65","doi-asserted-by":"publisher","DOI":"10.1002\/9780470627242.ch15"},{"key":"ref66","doi-asserted-by":"publisher","DOI":"10.1002\/0471791571"},{"key":"ref67","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2011.03.041"},{"key":"ref68","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2011.5975608"},{"key":"ref69","doi-asserted-by":"publisher","DOI":"10.1108\/IR-03-2018-0053"}],"container-title":["IEEE Transactions on Aerospace and Electronic Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/7\/11316225\/11397583.pdf?arnumber=11397583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,29]],"date-time":"2026-04-29T19:52:58Z","timestamp":1777492378000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11397583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":69,"URL":"https:\/\/doi.org\/10.1109\/taes.2026.3665850","relation":{},"ISSN":["0018-9251","1557-9603","2371-9877"],"issn-type":[{"value":"0018-9251","type":"print"},{"value":"1557-9603","type":"electronic"},{"value":"2371-9877","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}