{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:26:07Z","timestamp":1787012767965,"version":"build-2736575974"},"reference-count":0,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-009"},{"start":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T00:00:00Z","timestamp":1690848000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-001"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Artif. Intell."],"published-print":{"date-parts":[[2023,8]]},"DOI":"10.1109\/tai.2023.3267683","type":"journal-article","created":{"date-parts":[[2023,7,21]],"date-time":"2023-07-21T13:45:04Z","timestamp":1689947104000},"page":"589-591","source":"Crossref","is-referenced-by-count":4,"title":["Guest Editorial: Special Issue on Artificial Intelligence Methods for Maintenance and Safety of Automation Systems"],"prefix":"10.1109","volume":"4","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8600-9668","authenticated-orcid":false,"given":"Hongtian","family":"Chen","sequence":"first","affiliation":[{"name":"Chemical and Materials Engineering Department, University of Alberta, Edmonton, AB, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2143-2438","authenticated-orcid":false,"given":"Hao","family":"Luo","sequence":"additional","affiliation":[{"name":"School of Astronautics, Harbin Institute of Technology, Harbin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nishchal","family":"Verma","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3458-9303","authenticated-orcid":false,"given":"Bin","family":"Jiang","sequence":"additional","affiliation":[{"name":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","container-title":["IEEE Transactions on Artificial Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9078688\/10190086\/10190196.pdf?arnumber=10190196","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,23]],"date-time":"2025-08-23T01:08:56Z","timestamp":1755911336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10190196\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,8]]},"references-count":0,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tai.2023.3267683","relation":{},"ISSN":["2691-4581"],"issn-type":[{"value":"2691-4581","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,8]]}}}