{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,1]],"date-time":"2025-11-01T13:01:56Z","timestamp":1762002116004,"version":"build-2065373602"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,12]]},"DOI":"10.1109\/tale.2017.8252363","type":"proceedings-article","created":{"date-parts":[[2018,1,11]],"date-time":"2018-01-11T23:29:52Z","timestamp":1515713392000},"page":"368-371","source":"Crossref","is-referenced-by-count":9,"title":["A comprehension based intelligent assessment architecture"],"prefix":"10.1109","author":[{"given":"Sadhu Prasad","family":"Kar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jyotsna Kumar","family":"Mandai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rajeev","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Date of Access (DOA)","year":"0","key":"ref4"},{"journal-title":"Date of Access (DOA)","year":"0","key":"ref3"},{"journal-title":"Taxonomy of Educational Objectives the classification of educational goals- (Part 1 & 2)","year":"1956","author":"bloom","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/FIE.2001.963901"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TALE.2016.7851767"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1111\/j.2044-8279.1976.tb02980.x"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ITHET.2016.7760741"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-10-6427-2_12"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/FIE.1997.635894"}],"event":{"name":"2017 IEEE 6th International Conference on Teaching, Assessment and Learning for Engineering (TALE)","start":{"date-parts":[[2017,12,12]]},"location":"Hong Kong","end":{"date-parts":[[2017,12,14]]}},"container-title":["2017 IEEE 6th International Conference on Teaching, Assessment, and Learning for Engineering (TALE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8240062\/8252286\/08252363.pdf?arnumber=8252363","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,2,12]],"date-time":"2018-02-12T22:53:15Z","timestamp":1518475995000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8252363\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/tale.2017.8252363","relation":{},"subject":[],"published":{"date-parts":[[2017,12]]}}}