{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,11]],"date-time":"2026-01-11T16:20:14Z","timestamp":1768148414568,"version":"3.49.0"},"reference-count":50,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2009,7,1]],"date-time":"2009-07-01T00:00:00Z","timestamp":1246406400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2009,7]]},"DOI":"10.1109\/tase.2009.2021354","type":"journal-article","created":{"date-parts":[[2009,5,19]],"date-time":"2009-05-19T20:05:57Z","timestamp":1242763557000},"page":"514-524","source":"Crossref","is-referenced-by-count":12,"title":["Automated Refinement of Automated Visual Inspection Algorithms"],"prefix":"10.1109","volume":"6","author":[{"given":"H.C.","family":"Garcia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.R.","family":"Villalobos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"crossref","first-page":"279","DOI":"10.1016\/S0169-7161(80)01011-5","volume":"1","author":"mardia","year":"1980","journal-title":"Handbook of Statistics"},{"key":"ref38","doi-asserted-by":"crossref","DOI":"10.1002\/9781118032671","author":"gnanadesikan","year":"1997","journal-title":"Methods for Statistical Data Analysis of Multivariate Observations"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1023\/B:AIRE.0000045502.10941.a9"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-015-3994-4"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.2307\/1266761"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.2307\/2528963"},{"key":"ref37","author":"johnson","year":"1996","journal-title":"Applied multivariate statistical analysis"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9473(03)00008-2"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/69.991726"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-8655(03)00165-X"},{"key":"ref28","author":"hair","year":"1995","journal-title":"Multivariate Data Analysis with Readings"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2006.877399"},{"key":"ref29","author":"barnet","year":"1994","journal-title":"Outliers in Statistical Data"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s001380050135"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/11492429_82"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2003.809144"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00949659908548525"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1023\/A:1019770124060"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.2307\/3009929"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/34.824819"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0010-4809(87)90034-6"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1117\/12.60010"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.2307\/2344839"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1006\/rtim.1995.1014"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"128","DOI":"10.1117\/12.150181","article-title":"review of automated visual inspection: part i conventional approaches","author":"bayro","year":"1993","journal-title":"Proc SPIE Conf Intell Robots Comput Vision X Algorithms Techniq"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1006\/jmva.1993.1063"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"159","DOI":"10.1117\/12.150182","article-title":"review of automated visual inspection: part ii approaches to intelligent systems","author":"bayro","year":"1993","journal-title":"Proc SPIE Conf Intell Robots Comput Vision X Algorithms Techniq"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/0734-189X(88)90108-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1006\/cviu.1996.0020"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TRA.2003.814516"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1006\/jasc.1994.1065"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1093\/bioinformatics\/19.1.90"},{"key":"ref18","article-title":"a survey of inspection strategy and sensor distribution studies in discrete-part manufacturing processes","author":"ding","year":"2006","journal-title":"IIE Trans"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(02)00122-1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-1201-7_2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0890-6955(99)00031-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1006\/rtim.1998.0147"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1117\/12.150141"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0278-6125(03)80001-8"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1002\/9781118625590"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.1982.4767309"},{"key":"ref46","doi-asserted-by":"crossref","DOI":"10.1002\/0471704091","author":"weisberg","year":"2005","journal-title":"Applied Linear Regression"},{"key":"ref45","author":"devore","year":"0","journal-title":"Probability and Statistics for Engineering and the Sciences"},{"key":"ref48","author":"myers","year":"2002","journal-title":"Response Surface Methodology"},{"key":"ref47","author":"montgomery","year":"2001","journal-title":"Introduction to Linear Regression Analysis"},{"key":"ref42","author":"weisstein","year":"0","journal-title":"From MathWorld-A Wolfram Web Resource"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.2307\/2334770"},{"key":"ref44","author":"williams","year":"2004","journal-title":"Development of a feature selection methodology for automated visual inspection systems"},{"key":"ref43","author":"rencher","year":"1998","journal-title":"Multivariate Statistical Inference and Applications"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8856\/5153598\/04926125.pdf?arnumber=4926125","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:08Z","timestamp":1633909928000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4926125\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,7]]},"references-count":50,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tase.2009.2021354","relation":{},"ISSN":["1545-5955"],"issn-type":[{"value":"1545-5955","type":"print"}],"subject":[],"published":{"date-parts":[[2009,7]]}}}