{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T21:29:17Z","timestamp":1784150957987,"version":"3.55.0"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2013,7,1]],"date-time":"2013-07-01T00:00:00Z","timestamp":1372636800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2013,7]]},"DOI":"10.1109\/tase.2013.2244082","type":"journal-article","created":{"date-parts":[[2013,6,28]],"date-time":"2013-06-28T18:55:40Z","timestamp":1372445740000},"page":"554-561","source":"Crossref","is-referenced-by-count":63,"title":["Automated Pick-Place of Silicon Nanowires"],"prefix":"10.1109","volume":"10","author":[{"given":"Xutao","family":"Ye","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Changhai","family":"Ru","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun","family":"Luo","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shaorong","family":"Xie","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu","family":"Sun","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2010.2044746"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1021\/nl802556d"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1177\/0278364908097212"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/6\/065705"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/20\/3\/035009"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1063\/1.3466663"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/nl801347x"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2007.905739"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2011.2153825"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICMA.2011.5985653"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1021\/nl201460v"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.84.5552"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/jp002828d"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"554","DOI":"10.1021\/nl8026718","article-title":"Piezoresistive InGaAs\/GaAs nanosprings with metal connectors","volume":"9","author":"hwang","year":"2009","journal-title":"Nano Lett"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JMEMS.2009.2029975"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"674","DOI":"10.1109\/TNANO.2010.2065236","article-title":"Automated four-point probe measurement of individual nanowires inside a scanning electron microscope","volume":"10","author":"ru","year":"2011","journal-title":"IEEE Trans Nanotechnol"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2010.938721"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s12213-008-0001-2"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"20","DOI":"10.1021\/nl071626r","article-title":"Wafer-scale assembly of highly ordered semiconductor nanowire arrays by contact printing","volume":"8","author":"fan","year":"2008","journal-title":"Nano Lett"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/18\/5\/055013"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"177","DOI":"10.1016\/j.sna.2010.04.002","article-title":"Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages","volume":"166","author":"brown","year":"2011","journal-title":"Sens Actuators A"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/10\/3\/304"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1080\/15599610701232630"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/23\/6\/065304"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1073\/pnas.0506544102"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1126\/science.287.5453.637"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2015295"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201000278"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2006.53"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/30\/305701"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1163\/156856306777924644"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ROBOT.2009.5152440"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/21\/10\/105004"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1177\/0278364908099849"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2166162"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2009.2034831"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8856\/6549150\/06472260.pdf?arnumber=6472260","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:38:45Z","timestamp":1638218325000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6472260\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7]]},"references-count":36,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tase.2013.2244082","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,7]]}}}