{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T17:49:31Z","timestamp":1776361771025,"version":"3.51.2"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2017,4,1]],"date-time":"2017-04-01T00:00:00Z","timestamp":1491004800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Hong Kong Research Grants Council under","award":["138213"],"award-info":[{"award-number":["138213"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/tase.2015.2479088","type":"journal-article","created":{"date-parts":[[2015,10,2]],"date-time":"2015-10-02T19:06:04Z","timestamp":1443812764000},"page":"1031-1041","source":"Crossref","is-referenced-by-count":15,"title":["Monitoring Spatial Uniformity of Particle Distributions in Manufacturing Processes Using the K Function"],"prefix":"10.1109","volume":"14","author":[{"given":"Xiaohu","family":"Huang","sequence":"first","affiliation":[]},{"given":"Qiang","family":"Zhou","sequence":"additional","affiliation":[]},{"given":"Li","family":"Zeng","sequence":"additional","affiliation":[]},{"given":"Xiaodong","family":"Li","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2012.163"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2011.587867"},{"key":"ref31","author":"russ","year":"2010","journal-title":"The Image Processing Handbook"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1023\/B:JMSC.0000025862.23609.6f"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11661-009-0013-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1115\/1.4027339"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-577X(02)01401-5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-0136(02)00098-5"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1002\/9781119115151","author":"cressie","year":"1993","journal-title":"Statistics for Spatial Data"},{"key":"ref15","first-page":"214","author":"illian","year":"2008","journal-title":"Statistical Analysis and Modelling of Spatial Point Patterns"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2012.09.013"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2012.07.018"},{"key":"ref18","first-page":"22","author":"ripley","year":"1991","journal-title":"Statistical Inference for Spatial Processes"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1214\/aop\/1176995943"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/nme.1969"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.1580099"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1198\/016214508000000689"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"149","DOI":"10.2464\/jilm.49.149","article-title":"Fabrication process of metal matrix composite with nano-size SiC particle produced by vortex method","volume":"49","author":"akio","year":"1999","journal-title":"J Japan Institute of Light Metals"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200401933"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.2307\/1269551"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mser.2006.06.001"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.msea.2004.07.024"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S1359-6454(00)00147-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/KEM.270-273.808"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1115\/1.2714583"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/02772240600610822"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1017\/S0021900200105303"},{"key":"ref22","first-page":"100","author":"montgomery","year":"2007","journal-title":"Introduction to Statistical Quality Control"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.2307\/3213436"},{"key":"ref24","doi-asserted-by":"crossref","DOI":"10.1080\/00224065.2014.11917956","article-title":"From profile to surface monitoring: SPC for cylindrical surfaces via Gaussian processes","volume":"46","author":"colosimo","year":"2014","journal-title":"J Qual Technol"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-3799-8"},{"key":"ref26","first-page":"273","article-title":"Nonstationary covariance functions for Gaussian process regression","volume":"16","author":"paciorek","year":"2004","journal-title":"Adv Neural Inf Process Syst"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"359","DOI":"10.1080\/00224065.2014.11917977","article-title":"Statistical surface monitoring by spatial-structure modeling","volume":"46","author":"wang","year":"2014","journal-title":"J Qual Technol"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8856\/7892903\/07287800.pdf?arnumber=7287800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,11]],"date-time":"2024-06-11T14:47:16Z","timestamp":1718117236000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7287800\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":33,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tase.2015.2479088","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}