{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,3]],"date-time":"2026-04-03T15:36:05Z","timestamp":1775230565843,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2017,4,1]],"date-time":"2017-04-01T00:00:00Z","timestamp":1491004800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/tase.2015.2493564","type":"journal-article","created":{"date-parts":[[2015,11,10]],"date-time":"2015-11-10T20:07:50Z","timestamp":1447186070000},"page":"1129-1138","source":"Crossref","is-referenced-by-count":74,"title":["A Novel Decentralized Process Monitoring Scheme Using a Modified Multiblock PCA Algorithm"],"prefix":"10.1109","volume":"14","author":[{"given":"Chudong","family":"Tong","sequence":"first","affiliation":[]},{"given":"Xuefeng","family":"Yan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2012.2214383"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"687","DOI":"10.1109\/TASE.2012.2230628","article-title":"Decentralized fault diagnosis of continuous annealing processes based on multilevel PCA","volume":"10","author":"liu","year":"2013","journal-title":"IEEE Trans Autom Sci Eng"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/cem.667"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2011.09.011"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.02.003"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199809\/10)12:5<301::AID-CEM515>3.3.CO;2-J"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/ie301945s"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/ie400544q"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2014.05.031"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(98)00023-7"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/ie302069q"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301761"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2013.2285571"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11515"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1021\/ie071496x"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0967-0661(95)00014-L"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00058-7"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/cem.800"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2010.05.004"},{"key":"ref22","author":"bishop","year":"2006","journal-title":"Pattern Recognition and Machine Learning"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.03.003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.02.027"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2013.09.006"},{"key":"ref25","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4471-0347-9","author":"chiang","year":"2001","journal-title":"Fault Detection and Diagnosis in Industrial Systems"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8856\/7892903\/07323880.pdf?arnumber=7323880","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T02:34:46Z","timestamp":1633919686000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7323880\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tase.2015.2493564","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,4]]}}}