{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,26]],"date-time":"2026-05-26T05:05:59Z","timestamp":1779771959511,"version":"3.53.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62373085"],"award-info":[{"award-number":["62373085"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52527810"],"award-info":[{"award-number":["52527810"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenyang Science and Technology Plan Project","award":["23-407-3-35"],"award-info":[{"award-number":["23-407-3-35"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities of China","doi-asserted-by":"publisher","award":["N2404014"],"award-info":[{"award-number":["N2404014"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities of China","doi-asserted-by":"publisher","award":["N25ZLE008"],"award-info":[{"award-number":["N25ZLE008"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tase.2026.3691867","type":"journal-article","created":{"date-parts":[[2026,5,14]],"date-time":"2026-05-14T20:01:14Z","timestamp":1778788874000},"page":"9797-9808","source":"Crossref","is-referenced-by-count":0,"title":["A Domain-Incremental Learning Framework Based on Defect Replay and Gaussian Mixup for Industrial Defect Detection"],"prefix":"10.1109","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-1103-8341","authenticated-orcid":false,"given":"Zhen","family":"Zhao","sequence":"first","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1256-1337","authenticated-orcid":false,"given":"Jinhai","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5200-8210","authenticated-orcid":false,"given":"Huanqun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Shenyang Paidelin Technology Company Ltd., Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9642-5705","authenticated-orcid":false,"given":"Fengyuan","family":"Zuo","sequence":"additional","affiliation":[{"name":"School of Information Science and Engineering, Northeastern University, Shenyang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3164-2156","authenticated-orcid":false,"given":"Xiangkai","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7237-8032","authenticated-orcid":false,"given":"He","family":"Ren","sequence":"additional","affiliation":[{"name":"College of Data Science, Taiyuan University of Technology, Taiyuan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3583364"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3040890"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1016\/j.ymssp.2023.110484","article-title":"Defect detection method for high-resolution weld based on wandering Gaussian and multi-feature enhancement fusion","volume":"199","author":"Li","year":"2023","journal-title":"Mech. Syst. Signal Process."},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1016\/j.ymssp.2025.113117","article-title":"A multi-expert diffusion model for surface defect detection of valve cores in special control valve equipment systems","volume":"237","author":"Shen","year":"2025","journal-title":"Mech. Syst. Signal Process."},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2022.3211195"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3590572"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01044"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2017.2773081"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00921"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3519164"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01732"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02223"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.587"},{"key":"ref14","first-page":"1","article-title":"Continual learning with deep generative replay","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Shin"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2023.3318891"},{"key":"ref16","doi-asserted-by":"crossref","DOI":"10.1016\/j.compind.2025.104290","article-title":"A task-oriented physical collaborative network for pipeline defect diagnosis in a magnetic flux leakage detection system","volume":"169","author":"Shen","year":"2025","journal-title":"Comput. Ind."},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.01913"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.00456"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3550210"},{"key":"ref20","first-page":"97","article-title":"Learning transferable features with deep adaptation networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Long"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58589-1_28"},{"key":"ref22","volume-title":"Detectron2","author":"Wu","year":"2019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01565"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.02846"},{"key":"ref25","first-page":"1","article-title":"Mixup: Beyond empirical risk minimization","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Zhang"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2004.10934"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00944"},{"key":"ref28","article-title":"Research on X-ray weld seam defect detection and size measurement method based on neural network self-optimization","volume":"133","author":"Zhang","year":"2024","journal-title":"Eng. Appl. Artif. Intell."},{"key":"ref29","first-page":"148","article-title":"Heterogeneous uncertainty sampling for supervised learning","volume-title":"Machine Learning Proceedings","author":"Lewis","year":"1994"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206627"},{"key":"ref31","first-page":"728","article-title":"Latent structured active learning","volume-title":"Proc. Neural Inf. Process. Syst.","volume":"26","author":"Luo"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1911.08287"},{"key":"ref33","first-page":"1","article-title":"Paying more attention to attention: Improving the performance of convolutional neural networks via attention transfer","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Zagoruyko"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2023.3248583"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-015-0315-7"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.3002583"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2023.01.041"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2018.00273"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2915404"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8856\/11323516\/11517457.pdf?arnumber=11517457","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,26]],"date-time":"2026-05-26T04:44:53Z","timestamp":1779770693000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11517457\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tase.2026.3691867","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}