{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T20:17:27Z","timestamp":1783714647055,"version":"3.55.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Automat. Sci. Eng."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tase.2026.3706252","type":"journal-article","created":{"date-parts":[[2026,6,22]],"date-time":"2026-06-22T19:59:21Z","timestamp":1782158361000},"page":"12238-12255","source":"Crossref","is-referenced-by-count":0,"title":["TRO-CBF-Based Safety-Critical Formation Control of Multi-QUAV Systems: A Low-Complexity Method Under Limited Communication and Sensing Range"],"prefix":"10.1109","volume":"23","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-9467-557X","authenticated-orcid":false,"given":"Ang","family":"Li","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8076-9084","authenticated-orcid":false,"given":"Hongtao","family":"Yin","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2692-3829","authenticated-orcid":false,"given":"Ping","family":"Fu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Lan","family":"Duo","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, Heilongjiang, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3282661"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-021-07080-0"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2024.3387836"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2025.3619537"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2025.3580147"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3420697"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2025.110868"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2025.3579157"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3573343"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IROS51168.2021.9636670"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3182\/20050703-6-CZ-1902.00743"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2016.2638961"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2016.7524935"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2021.3105491"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2023.3309130"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2025.3538742"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2025.3563189"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2025.3571320"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2024.100947"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CDC51059.2022.9992763"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-025-11616-z"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/LRA.2021.3135569"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2025.3536215"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2024.3427372"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2024.3352707"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2024.3417971"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2023.3286090"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2023.3339719"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2023.3341345"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/LCSYS.2021.3087443"}],"container-title":["IEEE Transactions on Automation Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8856\/11323516\/11574701.pdf?arnumber=11574701","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T19:41:41Z","timestamp":1783712501000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11574701\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/tase.2026.3706252","relation":{},"ISSN":["1545-5955","1558-3783"],"issn-type":[{"value":"1545-5955","type":"print"},{"value":"1558-3783","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}