{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,26]],"date-time":"2026-06-26T14:02:45Z","timestamp":1782482565148,"version":"3.54.5"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry of Science and ICT (MSIT), Korea","award":["2021M3F3A2A01037365"],"award-info":[{"award-number":["2021M3F3A2A01037365"]}]},{"name":"Ministry of Science and ICT (MSIT), Korea","award":["2020M3C1B8A01111568"],"award-info":[{"award-number":["2020M3C1B8A01111568"]}]},{"name":"Information Technology Research Center"},{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP), Korea"},{"name":"MSIT, Korea","award":["IITP-2020-0-01778"],"award-info":[{"award-number":["IITP-2020-0-01778"]}]},{"name":"IDEC, Korea"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Biomed. Circuits Syst."],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/tbcas.2022.3193944","type":"journal-article","created":{"date-parts":[[2022,7,26]],"date-time":"2022-07-26T19:28:28Z","timestamp":1658863708000},"page":"679-691","source":"Crossref","is-referenced-by-count":16,"title":["A PVT-Robust AFE-Embedded Error-Feedback Noise-Shaping SAR ADC With Chopper-Based Passive High-Pass IIR Filtering for Direct Neural Recording"],"prefix":"10.1109","volume":"16","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0568-0845","authenticated-orcid":false,"given":"Kyeongwon","family":"Jeong","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0461-6729","authenticated-orcid":false,"given":"Yoontae","family":"Jung","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8501-6575","authenticated-orcid":false,"given":"Gichan","family":"Yun","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4661-6073","authenticated-orcid":false,"given":"Donghyun","family":"Youn","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4731-240X","authenticated-orcid":false,"given":"Yehhyun","family":"Jo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hyunjoo Jenny","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3589-086X","authenticated-orcid":false,"given":"Sohmyung","family":"Ha","sequence":"additional","affiliation":[{"name":"Division of Engineering, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4580-2771","authenticated-orcid":false,"given":"Minkyu","family":"Je","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42613.2021.9366008"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3020194"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870463"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2364824"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3018478"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2930903"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662299"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3108620"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3137540"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2871081"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2991526"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2749426"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2624989"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1212\/WNL.51.4.1063"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1111\/j.1528-1167.2010.02536.x"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/OJSSCS.2021.3119910"},{"key":"ref22","doi-asserted-by":"crossref","first-page":"735","DOI":"10.1109\/TBCAS.2014.2298860","article-title":"A 0.45 V 100-channel neural-recording IC with sub- ?W\/channel consumption in 0.18 ?m CMOS","volume":"7","author":"han","year":"2013","journal-title":"IEEE Trans Biomed Circuits Syst"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.811979"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2528999"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2011.2181842"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662458"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2870555"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1152\/jn.2000.84.1.390"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1016\/j.xpro.2021.100572"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2017.2694638"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2015.2498973"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3019487"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41551-018-0323-x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2816464"},{"key":"ref14","first-page":"2811","article-title":"An 80-mVpp linear-input range, 1.6-G? input impedance, low-power chopper amplifier for closed-loop neural recording that is tolerant to 650-mVpp common-mode interference","volume":"52","author":"chandrakumar","year":"2017","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2346779"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2052403"},{"key":"ref17","first-page":"239","article-title":"6.5?W 92.3dB-DR biopotential recording front-end with 360mVpp linear input range","author":"bang","year":"0","journal-title":"Proc IEEE Symp VLSI Circuits"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2876468"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2016.2614845"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1097\/00004691-200401000-00002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nrn2196"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1111\/j.1525-1403.1998.tb00014.x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1159\/000099395"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s13311-014-0280-3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1111\/j.1525-1403.1998.tb00013.x"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2931811"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.clinph.2014.01.006"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2819207"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2015.2417124"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8777942"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2143870"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3137342"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2944842"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2017.8008492"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2016.7844197"}],"container-title":["IEEE Transactions on Biomedical Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/4156126\/9916560\/09840883.pdf?arnumber=9840883","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,10,14]],"date-time":"2022-10-14T18:06:30Z","timestamp":1665770790000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9840883\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":51,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tbcas.2022.3193944","relation":{},"ISSN":["1932-4545","1940-9990"],"issn-type":[{"value":"1932-4545","type":"print"},{"value":"1940-9990","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}