{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T00:01:04Z","timestamp":1752192064923,"version":"3.41.2"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[1976,6,1]],"date-time":"1976-06-01T00:00:00Z","timestamp":202435200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1976,6,1]],"date-time":"1976-06-01T00:00:00Z","timestamp":202435200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1976,6,1]],"date-time":"1976-06-01T00:00:00Z","timestamp":202435200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1976,6]]},"DOI":"10.1109\/tc.1976.1674656","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"569-578","source":"Crossref","is-referenced-by-count":63,"title":["A Highly Efficient Redundancy Scheme: Self-Purging Redundancy"],"prefix":"10.1109","volume":"C-25","author":[{"family":"Losq","sequence":"first","affiliation":[{"name":"Digital Systems Laboratory, Department of Electrical Engineering and Department of Computer Science, Stanford University"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1975.5214914"},{"key":"ref11","doi-asserted-by":"crossref","DOI":"10.21236\/AD0438911","author":"knox-seith","year":"1963","journal-title":"A redundancy technique for improving the reliability of digital systems"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223709"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223707"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1479992.1480000"},{"key":"ref15","first-page":"229","author":"pierce","year":"1962","journal-title":"Redundancy Techniques for Computing Systems"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-4832-0016-3.50014-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1971.223239"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224016"},{"journal-title":"Techniques for realization of ultra-reliable spaceborn computers","year":"1966","author":"goldberg","key":"ref4"},{"year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1147\/rd.62.0200"},{"key":"ref5","first-page":"43","author":"von neumann","year":"1965","journal-title":"Automata Studies (Annals of Mathematical Studies)"},{"key":"ref8","first-page":"375","article-title":"reliability analysis and architecture of a highly redundant digital system: generalized triple modular redundancy with self-repair","volume":"26","author":"mathur","year":"1970","journal-title":"Proc SJCC"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1964.5214855"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/800195.805940"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1465611.1465708"},{"journal-title":"Phase II of an architectural study for a self-repairing computer","year":"1967","author":"roth","key":"ref9"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1975.5215106"},{"key":"ref22","first-page":"81","article-title":"influence of fault-detection and switching mechanisms on the reliability of stand-by systems","author":"losq","year":"1975","journal-title":"Proc FTC\/5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1971.223142"},{"key":"ref23","doi-asserted-by":"crossref","first-page":"1306","DOI":"10.1109\/T-C.1971.223132","article-title":"reliability modeling for fault-tolerant computers","volume":"c 20","author":"bouricius","year":"1971","journal-title":"IEEE Transactions on Computers"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35148\/01674656.pdf?arnumber=1674656","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,9]],"date-time":"2025-07-09T23:08:17Z","timestamp":1752102497000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1674656\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1976,6]]},"references-count":23,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tc.1976.1674656","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[1976,6]]}}}