{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T16:35:26Z","timestamp":1774370126970,"version":"3.50.1"},"reference-count":7,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[1980,11,1]],"date-time":"1980-11-01T00:00:00Z","timestamp":341884800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1980,11,1]],"date-time":"1980-11-01T00:00:00Z","timestamp":341884800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1980,11,1]],"date-time":"1980-11-01T00:00:00Z","timestamp":341884800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1980,11]]},"DOI":"10.1109\/tc.1980.1675500","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"1025-1029","source":"Crossref","is-referenced-by-count":9,"title":["Dual-Mode Logic for Function-Independent Fault Testing"],"prefix":"10.1109","volume":"C-29","author":[{"family":"Dasgupta","sequence":"first","affiliation":[{"name":"IBM Data Systems Division"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Hartmann","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Rudolph","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675129"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223475"},{"key":"ref6","author":"peterson","year":"1972","journal-title":"Error-Correcting Codes"},{"key":"ref5","article-title":"testability enhancement in digital system designs","author":"chuang","year":"1975","journal-title":"Proc IEEE INTERCON Conf"},{"key":"ref7","author":"dasgupta","year":"1977","journal-title":"Dual-mode logic for function-independent fault-testing"},{"key":"ref2","author":"chang","year":"1970","journal-title":"Fault Diagnosis of Digital Systems"},{"key":"ref1","author":"friedman","year":"1971","journal-title":"Fault Detection in Digital Circuits"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35188\/01675500.pdf?arnumber=1675500","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,17]],"date-time":"2025-07-17T17:56:26Z","timestamp":1752774986000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1675500\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1980,11]]},"references-count":7,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tc.1980.1675500","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[1980,11]]}}}