{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T14:44:49Z","timestamp":1754145889222,"version":"3.41.2"},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[1981,8,1]],"date-time":"1981-08-01T00:00:00Z","timestamp":365472000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1981,8,1]],"date-time":"1981-08-01T00:00:00Z","timestamp":365472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1981,8,1]],"date-time":"1981-08-01T00:00:00Z","timestamp":365472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1981,8]]},"DOI":"10.1109\/tc.1981.1675847","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"600-604","source":"Crossref","is-referenced-by-count":27,"title":["Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults"],"prefix":"10.1109","volume":"C-30","author":[{"family":"Malaiya","sequence":"first","affiliation":[{"name":"Research Group on Design Automation and Fault-Tolerant Computing, School of Advanced Technology, State University of New York"}]},{"family":"Su","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Modeling testing and reliability analysis of intermittent faults in digital systems","year":"1978","author":"malaiya","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1479992.1480000"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674656"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675557"},{"key":"ref4","first-page":"34","article-title":"projecting vlsi's impact on microprocessors","author":"quessec","year":"1979","journal-title":"IEEE Spectrum"},{"key":"ref3","first-page":"577","article-title":"a survey of intermittent fault analysis","author":"malaiya","year":"1979","journal-title":"Proc Nat Comput Conf"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675397"},{"key":"ref5","first-page":"333","article-title":"modeling transient faults in tmr computer systems","author":"merryman","year":"1975","journal-title":"Proc 1975 Annu Reliability and Maintainability Symp"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675595"},{"key":"ref7","article-title":"model and random testing properties of intermittent failures in combinational circuits","author":"savir","year":"1978","journal-title":"J Des Automat Fault-Tolerant Comput"},{"journal-title":"Mathematical Theory of Reliability","year":"1965","author":"barlow","key":"ref2"},{"journal-title":"Reliability modeling and analysis for fault-tolerant computer","year":"1976","author":"ng","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675148"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35206\/01675847.pdf?arnumber=1675847","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,17]],"date-time":"2025-07-17T17:56:43Z","timestamp":1752775003000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1675847\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1981,8]]},"references-count":13,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tc.1981.1675847","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[1981,8]]}}}