{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:29:49Z","timestamp":1754152189702,"version":"3.41.2"},"reference-count":6,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[1985,3,1]],"date-time":"1985-03-01T00:00:00Z","timestamp":478483200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1985,3,1]],"date-time":"1985-03-01T00:00:00Z","timestamp":478483200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1985,3,1]],"date-time":"1985-03-01T00:00:00Z","timestamp":478483200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1985,3]]},"DOI":"10.1109\/tc.1985.1676573","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"287-290","source":"Crossref","is-referenced-by-count":11,"title":["Layout Influences Testability"],"prefix":"10.1109","volume":"C-34","author":[{"family":"Spencer","sequence":"first","affiliation":[{"name":"Stanford University"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Savir","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223428"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1972.5009041"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675251"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PGEC.1967.264621"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674835"},{"key":"ref1","first-page":"462","article-title":"a logic design structure for lsi testability","author":"eichelberger","year":"1977","journal-title":"Proc 14th Design Automat Conf"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35244\/01676573.pdf?arnumber=1676573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:05:01Z","timestamp":1753121101000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1676573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1985,3]]},"references-count":6,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tc.1985.1676573","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[1985,3]]}}}