{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,11,17]],"date-time":"2023-11-17T20:53:46Z","timestamp":1700254426905},"reference-count":11,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[1985,6,1]],"date-time":"1985-06-01T00:00:00Z","timestamp":486432000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1985,6]]},"DOI":"10.1109\/tc.1985.5009408","type":"journal-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T20:36:47Z","timestamp":1243975007000},"page":"553-557","source":"Crossref","is-referenced-by-count":16,"title":["Detecting I\/O and Internal Feedback Bridging Faults"],"prefix":"10.1109","volume":"C-34","author":[{"given":"Shiyi","family":"Xu","sequence":"first","affiliation":[]},{"given":"Stephen Y. H.","family":"Su","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675125"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224025"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1973.223600"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675457"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676604"},{"key":"ref5","article-title":"feedback bridging faults in general combinational networks","author":"lin","year":"1978","journal-title":"Proc Int Symp Fault-Tolerant Comput"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.1980.1585290"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675613"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224020"},{"key":"ref9","first-page":"214","article-title":"testing feedback bridging faults among internal input and output lines by two patterns","author":"xu","year":"1982","journal-title":"Proc ICCC 82"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1520\/STP10004S"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/5009397\/05009408.pdf?arnumber=5009408","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:40:16Z","timestamp":1638218416000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5009408\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1985,6]]},"references-count":11,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tc.1985.5009408","relation":{},"ISSN":["0018-9340"],"issn-type":[{"value":"0018-9340","type":"print"}],"subject":[],"published":{"date-parts":[[1985,6]]}}}