{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T18:35:20Z","timestamp":1694630120139},"reference-count":13,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[1986,1,1]],"date-time":"1986-01-01T00:00:00Z","timestamp":504921600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1986,1]]},"DOI":"10.1109\/tc.1986.1676665","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T20:35:10Z","timestamp":1188938110000},"page":"81-85","source":"Crossref","is-referenced-by-count":10,"title":["The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's"],"prefix":"10.1109","volume":"C-35","author":[{"family":"Rajski","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Tyszer","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.5009407"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676277"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675264"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675251"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"476","DOI":"10.1109\/T-C.1975.224249","article-title":"fault masking in combinational logic circuits","volume":"c 24","author":"dias","year":"1975","journal-title":"IEEE Transactions on Computers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675716"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"850","DOI":"10.1109\/T-C.1974.224040","article-title":"minimal fault tests for combinational networks","volume":"c 23","author":"fridrich","year":"1974","journal-title":"IEEE Transactions on Computers"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1147\/rd.192.0098"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1979.1675429"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1972.223428"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675567"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675612"},{"key":"ref9","first-page":"106","article-title":"fault influence function for identification of multiple faults in combinational circuits","author":"rajski","year":"1983","journal-title":"FTCS-13"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35249\/01676665.pdf?arnumber=1676665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,11,29]],"date-time":"2021-11-29T20:40:18Z","timestamp":1638218418000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1676665\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,1]]},"references-count":13,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tc.1986.1676665","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[1986,1]]}}}