{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T12:45:35Z","timestamp":1759063535215,"version":"3.41.2"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[1986,1,1]],"date-time":"1986-01-01T00:00:00Z","timestamp":504921600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1986,1,1]],"date-time":"1986-01-01T00:00:00Z","timestamp":504921600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1986,1,1]],"date-time":"1986-01-01T00:00:00Z","timestamp":504921600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1986,1]]},"DOI":"10.1109\/tc.1986.1676666","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"85-90","source":"Crossref","is-referenced-by-count":3,"title":["On the Impossible Class of Faulty Functions in Logic Networks Under Short Circuit Faults"],"prefix":"10.1109","volume":"C-35","author":[{"family":"Bhattacharya","sequence":"first","affiliation":[{"name":"Indian Statistical Institute"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Gupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"446","article-title":"syndrome testable design of combinational networks for detecting stuck-at and bridging faults","author":"bhattacharya","year":"1983","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1971.223163"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674661"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1981.1675840"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1983.12669"},{"journal-title":"Logical Processing of Digital Signals","year":"1978","author":"hurst","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675603"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676204"},{"key":"ref18","first-page":"847","article-title":"logical modeling of physical failures and their inherent syndrome testability in mos lsi\/vlsi networks","author":"bhattacharya","year":"1984","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1985.1676604"},{"key":"ref3","first-page":"214","article-title":"testing feedback bridging faults among internal, input and output lines by two patterns","author":"xu","year":"1982","journal-title":"Proc IEEE Int Conf Circuits Comput ICCC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675125"},{"key":"ref5","first-page":"129","article-title":"nonstuck-at fault detection in nmos circuits by region analysis","author":"lamoureux","year":"1983","journal-title":"Proc IEEE Int Test Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675613"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675457"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224025"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1974.224020"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675614"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35249\/01676666.pdf?arnumber=1676666","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:05:09Z","timestamp":1753121109000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1676666\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,1]]},"references-count":18,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tc.1986.1676666","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[1986,1]]}}}