{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:29:55Z","timestamp":1754152195847,"version":"3.41.2"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[1986,7,1]],"date-time":"1986-07-01T00:00:00Z","timestamp":520560000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[1986,7,1]],"date-time":"1986-07-01T00:00:00Z","timestamp":520560000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[1986,7,1]],"date-time":"1986-07-01T00:00:00Z","timestamp":520560000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[1986,7]]},"DOI":"10.1109\/tc.1986.1676811","type":"journal-article","created":{"date-parts":[[2007,9,4]],"date-time":"2007-09-04T16:35:10Z","timestamp":1188923710000},"page":"658-662","source":"Crossref","is-referenced-by-count":4,"title":["Testable Design of Single-Output Sequential Machines Using Checking Experiments"],"prefix":"10.1109","volume":"C-35","author":[{"family":"Saluja","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, University of Wisconsin"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Dandapani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1983.1676225"},{"key":"ref11","first-page":"167","article-title":"transition count testing of sequential machines","author":"venkatraman","year":"1980","journal-title":"Proc Fault Tolerant Computer Symp"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.5009368"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675603"},{"key":"ref14","first-page":"108","article-title":"testing logic circuits with compressed data","author":"fujiwara","year":"1978","journal-title":"Proc Eighth Int Conf Fault Tolerant Comput"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-95424-5"},{"journal-title":"Testable design of sequential machines using checking experiments","year":"0","author":"saluja","key":"ref16"},{"journal-title":"A testable design method for sequential circuits","year":"1985","author":"saluja","key":"ref17"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675142"},{"key":"ref3","first-page":"183","article-title":"built-in verification test","author":"mccluskey","year":"1982","journal-title":"Proc 1982 Int Test Conf"},{"key":"ref6","first-page":"315","article-title":"design of generators for built-in test","author":"dandapani","year":"1984","journal-title":"Proc 1984 Int Test Conf"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1976.1674661"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/SWCT.1964.8"},{"key":"ref7","first-page":"129","author":"moore","year":"0","journal-title":"Automata Studies"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1982.1675879"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MC.1984.1658965"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/T-C.1975.224313"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/12\/35257\/01676811.pdf?arnumber=1676811","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:05:14Z","timestamp":1753121114000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1676811\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1986,7]]},"references-count":17,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tc.1986.1676811","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[1986,7]]}}}