{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T10:40:57Z","timestamp":1769856057484,"version":"3.49.0"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2015,3,1]],"date-time":"2015-03-01T00:00:00Z","timestamp":1425168000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2015,3]]},"DOI":"10.1109\/tc.2013.2295825","type":"journal-article","created":{"date-parts":[[2014,1,31]],"date-time":"2014-01-31T17:45:20Z","timestamp":1391190320000},"page":"847-861","source":"Crossref","is-referenced-by-count":18,"title":["RDIS: Tolerating Many Stuck-At Faults in Resistive Memory"],"prefix":"10.1109","volume":"64","author":[{"given":"Rakan","family":"Maddah","sequence":"first","affiliation":[{"name":"Department of Computer Science , University of Pittsburgh, 210 S. Bouquet, Pittsburgh"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rami","family":"Melhem","sequence":"additional","affiliation":[{"name":"Department of Computer Science , University of Pittsburgh, 210 S. Bouquet, Pittsburgh"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sangyeun","family":"Cho","sequence":"additional","affiliation":[{"name":"Memory Division of Samsung Electronics Co."}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","year":"2011","journal-title":"Phase Change Memory (pcm)"},{"key":"ref12","author":"bourzac","year":"2010","journal-title":"Memristor Memory Readied for Production"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2011.5749753"},{"key":"ref14","first-page":"449","article-title":"A Study on the Failure Mechanism of a Phase-Change Memory in Write-Erase Cycling","volume":"30","author":"lee","year":"2009","journal-title":"IEEE Electron Device Letters"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.908001"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.888349"},{"key":"ref2","year":"2011"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2005.1609340"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377981"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1816014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1950.tb00463.x"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669157"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746415"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155658"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1116\/1.3301579"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"43","DOI":"10.1109\/L-CA.2012.20","article-title":"Data Dependent Sparing to Manage Better-than-Bad Blocks","volume":"12","author":"maddah","year":"2012","journal-title":"IEEE Computer Architecture Letters"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(60)90287-4"},{"key":"ref22","article-title":"A Chat about Micron's Clearn and Technology","author":"wong","year":"2010","journal-title":"Electronic Design"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2006.354942"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1815981"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2010.46"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/1816038.1815980"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2011.5749752"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555758"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1147\/rd.524.0439"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1555815.1555759"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/7031983\/06690215.pdf?arnumber=6690215","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,4,27]],"date-time":"2023-04-27T14:27:33Z","timestamp":1682605653000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6690215\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,3]]},"references-count":27,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tc.2013.2295825","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,3]]}}}