{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T06:25:24Z","timestamp":1776925524292,"version":"3.51.2"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2016,4,1]],"date-time":"2016-04-01T00:00:00Z","timestamp":1459468800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61303048"],"award-info":[{"award-number":["61303048"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["WK0110000040"],"award-info":[{"award-number":["WK0110000040"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"name":"CUHK MoE-Microsoft Key Laboratory of Human-centric Computing and Interface Technologies"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2016,4,1]]},"DOI":"10.1109\/tc.2014.2349505","type":"journal-article","created":{"date-parts":[[2014,8,19]],"date-time":"2014-08-19T18:24:08Z","timestamp":1408472648000},"page":"1131-1144","source":"Crossref","is-referenced-by-count":18,"title":["Analysis of Reliability Dynamics of SSD RAID"],"prefix":"10.1109","volume":"65","author":[{"given":"Yongkun","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Patrick P.C.","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John C.S.","family":"Lui","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-24403-2_20"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNC.2012.6167470"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1080\/15326348908807130"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/50202.50214"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISCIT.2009.5341269"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/1519065.1519081"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/RELDIS.1997.632790"},{"key":"ref36","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1115\/1.4010337","article-title":"A statistical distribution function of wide applicability","volume":"18","author":"weibull","year":"1951","journal-title":"J Appl Mech"},{"key":"ref35","article-title":"Quantifying reliability of solid-state storage from multiple aspects","author":"sun","year":"2011","journal-title":"Proc SNAPI"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CMPCON.1989.301913"},{"key":"ref10","author":"enderle","year":"0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1089733.1089735"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669118"},{"key":"ref13","first-page":"2","article-title":"The bleak future of NAND flash memory","author":"grupp","year":"2012","journal-title":"Proc 10th USENIX Conf File Storage Technol"},{"key":"ref14","author":"hess","year":"0"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1534530.1534544"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"80","DOI":"10.1109\/TC.2010.197","article-title":"Flash-aware RAID techniques for dependable and high-performance flash memory SSD","volume":"60","author":"im","year":"2011","journal-title":"IEEE Trans Comput"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1080\/03461238.1953.10419459"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1987816.1987835"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2013.6575359"},{"key":"ref28","first-page":"1","article-title":"Don't let RAID raid the lifetime of your SSD array","author":"moon","year":"2013","journal-title":"Proc 5th UNESIX Conf Hot Topics Storage File Syst"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627346"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558857"},{"key":"ref3","article-title":"The DiskSim simulation environment version 4.0 reference manual","author":"bucy","year":"2008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555371"},{"key":"ref29","first-page":"162","article-title":"Performance analysis of disk arrays under failure","author":"muntz","year":"1990","journal-title":"Proc 16th Int Conf Very Large Data Bases"},{"key":"ref5","first-page":"521","article-title":"Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis","author":"cai","year":"2012","journal-title":"Proc Conf Des Autom Test Eur"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-4828-4_3"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.543706"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1807060.1807061"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2367589.2367603"},{"key":"ref1","first-page":"57","article-title":"Design tradeoffs for SSD performance","author":"agrawal","year":"2008","journal-title":"Proc Annu Tech Conf"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2349896.2349900"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1629435.1629459"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1982185.1982266"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2465529.2465546"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/SRDS.2013.16"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/2093139.2093143"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1006\/jpdc.1993.1013"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/7430016\/06880366.pdf?arnumber=6880366","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,15]],"date-time":"2022-04-15T01:42:22Z","timestamp":1649986942000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6880366\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,4,1]]},"references-count":39,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tc.2014.2349505","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,4,1]]}}}