{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T15:55:09Z","timestamp":1762444509489,"version":"3.37.3"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2015,12,1]],"date-time":"2015-12-01T00:00:00Z","timestamp":1448928000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Shenzhen Foundamental Science Research Foundation","award":["JCYJ20120613140025732"],"award-info":[{"award-number":["JCYJ20120613140025732"]}]},{"DOI":"10.13039\/100001314","name":"SRF","doi-asserted-by":"publisher","award":["JCYJ20130329152316637"],"award-info":[{"award-number":["JCYJ20130329152316637"]}],"id":[{"id":"10.13039\/100001314","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2015,12,1]]},"DOI":"10.1109\/tc.2015.2401019","type":"journal-article","created":{"date-parts":[[2015,2,6]],"date-time":"2015-02-06T15:01:36Z","timestamp":1423234896000},"page":"3417-3429","source":"Crossref","is-referenced-by-count":11,"title":["Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction"],"prefix":"10.1109","volume":"64","author":[{"given":"Linfeng","family":"Chen","sequence":"first","affiliation":[]},{"given":"Aijiao","family":"Cui","sequence":"additional","affiliation":[]},{"given":"Chip-Hong","family":"Chang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","first-page":"95","author":"diestel","year":"1997","journal-title":"Graph Theory Graduate Texts in Mathematics"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2208644"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2011.38"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.61"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/359094.359101"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639634"},{"key":"ref35","first-page":"814","article-title":"A methodology to design efficient BIST test pattern generators","author":"chen","year":"0","journal-title":"Proc Int Test Conf"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"313","DOI":"10.1007\/BF02579451","article-title":"On Turán's theorem for sparse graphs","volume":"1","author":"ajtai","year":"1981","journal-title":"COMBINATORICA"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/12.241600"},{"key":"ref11","first-page":"219","article-title":"Test pattern decompression in parallel scan chain architecture","author":"chloupek","year":"0","journal-title":"Proc IEEE Int Sym Design Diagnostics Electron Circuits Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030445"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699274"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882509"},{"key":"ref15","first-page":"539","article-title":"New test data decompressor for low power applications","author":"mrugalski","year":"0","journal-title":"Proc ACM\/IEEE Design Autom Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IWECMS.2011.5952372"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.105"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ETSYM.2004.1347657"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1999.781060"},{"key":"ref28","first-page":"265","article-title":"On low-capture-power test generation for scan testing","author":"wen","year":"0","journal-title":"Proc VLSI Test Symp"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2009.178"},{"key":"ref27","first-page":"1","article-title":"California scan architecture for high quality and low power testing","author":"cho","year":"0","journal-title":"Proc Int Test Conf"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699203"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.118"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1002"},{"key":"ref5","first-page":"189","article-title":"Test generation and dynamic compaction of tests","author":"goel","year":"0","journal-title":"Proc IEEE Test Conf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.852285"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/43.856980"},{"key":"ref2","first-page":"456","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2002.1009155"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2002550"},{"key":"ref20","first-page":"1018","article-title":"A power-efficient scan tree design by exploring the Q’-D connection","author":"chen","year":"0","journal-title":"Proc IEEE Int Symp Circuits Syst"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2009.5351359"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-005-2719-2"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895840"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2003.1250798"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2006.1708693"},{"key":"ref25","first-page":"95","article-title":"An efficient zero-aliasing space compactor based on elementary gates","author":"liu","year":"0","journal-title":"Proc Int Conf Comput -Aided Design Comput Graph"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/7313054\/07035036.pdf?arnumber=7035036","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:45:50Z","timestamp":1641987950000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7035036\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12,1]]},"references-count":37,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tc.2015.2401019","relation":{},"ISSN":["0018-9340"],"issn-type":[{"type":"print","value":"0018-9340"}],"subject":[],"published":{"date-parts":[[2015,12,1]]}}}