{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,22]],"date-time":"2026-03-22T06:27:51Z","timestamp":1774160871472,"version":"3.50.1"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2016,1,1]],"date-time":"2016-01-01T00:00:00Z","timestamp":1451606400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2016,1,1]]},"DOI":"10.1109\/tc.2015.2417538","type":"journal-article","created":{"date-parts":[[2015,3,29]],"date-time":"2015-03-29T02:45:19Z","timestamp":1427597119000},"page":"30-41","source":"Crossref","is-referenced-by-count":26,"title":["A New Parallel VLSI Architecture for Real-Time Electrical Capacitance Tomography"],"prefix":"10.1109","volume":"65","author":[{"given":"Ahmad","family":"Fajar Firdaus","sequence":"first","affiliation":[]},{"given":"Mahmoud","family":"Meribout","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.250"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IPDPS.2010.5470402"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2354984"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.874302"},{"key":"ref14","article-title":"Digital Integrated Circuit: A Design Perspective","author":"rabaey","year":"2003"},{"key":"ref15","year":"0"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.895665"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.12.022"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"72","DOI":"10.1049\/ip-g-2.1992.0013","article-title":"Tomographic imaging of industrial process equipment—Review of needs and methods","volume":"139","author":"dikcin","year":"1992","journal-title":"IEEE Proc G Electron Circuits Syst"},{"key":"ref3","article-title":"Multiphase flow meters: Principles and applications: A review","volume":"2","author":"teniou","year":"2011","journal-title":"Can J Sci Ind Res"},{"key":"ref6","first-page":"37","article-title":"New progress of the digital electrical capacitance tomography system for gas\/liquid two phase flow","author":"wang","year":"0","journal-title":"Proc IEEE Int Imaging Systems and Techniques Workshop"},{"key":"ref5","article-title":"Parallel realization of the linear back projection algorithm for capacitance tomography using TMS320C6701 digital signal processor","author":"garcia-nocetti","year":"2003"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2236731"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1186\/1475-925X-13-126"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.825039"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/14\/1\/201"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2011.5946827"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/7350319\/7070745.pdf?arnumber=7070745","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:57:35Z","timestamp":1642003055000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7070745\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,1,1]]},"references-count":17,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tc.2015.2417538","relation":{},"ISSN":["0018-9340"],"issn-type":[{"value":"0018-9340","type":"print"}],"subject":[],"published":{"date-parts":[[2016,1,1]]}}}