{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:45:55Z","timestamp":1780443955370,"version":"3.54.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2016,7,1]],"date-time":"2016-07-01T00:00:00Z","timestamp":1467331200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2016,7,1]]},"DOI":"10.1109\/tc.2015.2479606","type":"journal-article","created":{"date-parts":[[2015,9,18]],"date-time":"2015-09-18T06:08:41Z","timestamp":1442556521000},"page":"2339-2345","source":"Crossref","is-referenced-by-count":4,"title":["Testing Neighbouring Cell Leakage and Transition Induced Faults in DRAMs"],"prefix":"10.1109","volume":"65","author":[{"given":"Yiorgos","family":"Sfikas","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yiorgos","family":"Tsiatouhas","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012108"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2266281"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.04.0804.0007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SMELEC.2008.4770357"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.1998.741638"},{"key":"ref15","first-page":"225","article-title":"Efficient neighborhood pattern-sensitive fault test algorithms for semiconductor memories","author":"cheng","year":"0","journal-title":"Proc IEEE VLSI Test Symp"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2002.804101"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1991.208150"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.46"},{"key":"ref19","first-page":"927","article-title":"A novel screen-ability estimation methodology for DRAM with a test algorithm simulator: FS5","author":"jeong","year":"0","journal-title":"Proc Int Tech Conf Circuits\/Syst Comput Commun"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1979.1051201"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9260(96)00007-7"},{"key":"ref6","first-page":"45?60, 125","author":"van de goor","year":"1991","journal-title":"Testing Semiconductor Memories-Theory and Practice"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-1451-6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.04.0804.0007"},{"key":"ref7","first-page":"18","article-title":"Scaling the memory reliability wall","volume":"17","author":"wilkerson","year":"2013","journal-title":"Intel Technol J"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.344"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1147\/rd.462.0187"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1980.1675556"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2161785"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700631"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630097"},{"key":"ref23","author":"jacob","year":"2008","journal-title":"Memory Systems"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/7486166\/07271071.pdf?arnumber=7271071","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:45:05Z","timestamp":1642005905000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7271071\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7,1]]},"references-count":23,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tc.2015.2479606","relation":{},"ISSN":["0018-9340"],"issn-type":[{"value":"0018-9340","type":"print"}],"subject":[],"published":{"date-parts":[[2016,7,1]]}}}