{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,29]],"date-time":"2026-03-29T16:33:33Z","timestamp":1774802013552,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2017,9,1]],"date-time":"2017-09-01T00:00:00Z","timestamp":1504224000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2017,9,1]]},"DOI":"10.1109\/tc.2017.2691009","type":"journal-article","created":{"date-parts":[[2017,4,5]],"date-time":"2017-04-05T18:53:18Z","timestamp":1491418398000},"page":"1599-1612","source":"Crossref","is-referenced-by-count":25,"title":["Performance\/Reliability-Aware Resource Management for Many-Cores in Dark Silicon Era"],"prefix":"10.1109","volume":"66","author":[{"given":"Mohammad-Hashem","family":"Haghbayan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Miele","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Amir M.","family":"Rahmani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pasi","family":"Liljeberg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hannu","family":"Tenhunen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2011.87"},{"key":"ref38","year":"2013"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378665"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2539124"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653583"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.micpro.2013.11.009"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/980152.980157"},{"key":"ref36","article-title":"Dark versus dim silicon and near-threshold computing extended results","author":"wang","year":"2012","journal-title":"Tech Rep TR-2013-01"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ASAP.2015.7245728"},{"key":"ref10","first-page":"854","article-title":"A Lifetime-Aware Runtime Mapping Approach for Many-Core Systems in the Dark Silicon Era","author":"mohammad-hashem haghbayan","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974729"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2591798"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1945023.1945033"},{"key":"ref13","year":"2016"},{"key":"ref14","year":"2016"},{"key":"ref15","first-page":"1","article-title":"Voltage island management in near\n threshold manycore architectures to mitigate dark silicon","author":"silvano","year":"2014","journal-title":"Proc Des Autom Test Europe Conf"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.35"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001388"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974718"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/2380445.2380455"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669169"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1878961.1879013"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2370816.2370821"},{"key":"ref3","year":"2010","journal-title":"Failure Mechanisms and Models for Semiconductor Devices"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2463209.2488782"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2010.5654250"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/RSP.2007.26"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2744849"},{"key":"ref7","first-page":"1","article-title":"MapPro: Proactive runtime mapping for dynamic workloads by quantifying ripple effect of\n applications on networks-on-chip","author":"haghbayan","year":"2015","journal-title":"Proc Int Symp Netw -on-Chip"},{"key":"ref2","year":"2015"},{"key":"ref9","first-page":"463","article-title":"Learning-based dynamic reliability management for dark silicon processor\n considering EM effects","author":"kim","year":"2016","journal-title":"Proc Des Autom Test Europe Conf"},{"key":"ref1","author":"rahmani","year":"2016","journal-title":"The Dark Side of Silicon"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2014.6974677"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2004.1310781"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.281"},{"key":"ref24","first-page":"61:1","article-title":"Combined DVFS and mapping exploration for lifetime and soft-error susceptibility\n improvement in MPSoCs","author":"das","year":"2014","journal-title":"Proc Des Autom Test Europe Conf"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2007.915477"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/1555349.1555369"},{"key":"ref25","volume":"1","year":"2000"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/8003558\/07892847.pdf?arnumber=7892847","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:40:16Z","timestamp":1642005616000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7892847\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,9,1]]},"references-count":40,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tc.2017.2691009","relation":{},"ISSN":["0018-9340"],"issn-type":[{"value":"0018-9340","type":"print"}],"subject":[],"published":{"date-parts":[[2017,9,1]]}}}