{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,13]],"date-time":"2026-03-13T15:10:42Z","timestamp":1773414642602,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,1]],"date-time":"2020-10-01T00:00:00Z","timestamp":1601510400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2020,10,1]]},"DOI":"10.1109\/tc.2018.2860010","type":"journal-article","created":{"date-parts":[[2018,7,25]],"date-time":"2018-07-25T18:55:45Z","timestamp":1532544945000},"page":"1449-1459","source":"Crossref","is-referenced-by-count":25,"title":["Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot-Extended Version"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9320-2685","authenticated-orcid":false,"given":"Aurelien","family":"Vasselle","sequence":"first","affiliation":[]},{"given":"Hugues","family":"Thiebeauld","sequence":"additional","affiliation":[]},{"given":"Quentin","family":"Maouhoub","sequence":"additional","affiliation":[]},{"given":"Adele","family":"Morisset","sequence":"additional","affiliation":[]},{"given":"Sebastien","family":"Ermeneux","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","article-title":"Static fault attack on hardware DES registers","author":"loubet-moundi","year":"2011","journal-title":"IACR Cryptology ePrint Archive"},{"key":"ref11","first-page":"27","article-title":"DFA on AES","author":"giraud","year":"2004","journal-title":"Proc 4th Conf Advanced Encryption Standard"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9083-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581576"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s001450010016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2014.7004184"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311880"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_26"},{"key":"ref18","year":"2017","journal-title":"PDM+ (Pulse-on-Demand Modules) and S-LMS (Single Laser Microscope Station)"},{"key":"ref19","article-title":"Exploiting trustzone on android","author":"shen","year":"2015","journal-title":"Black Hat USA"},{"key":"ref4","first-page":"3056","article-title":"Electromagnetic fault injection: Towards a fault model on a 32-bit microcontroller","volume":"100","author":"moro","year":"2012","journal-title":"Proc IEEE"},{"key":"ref3","article-title":"Yet another fault injection technique: By forward body biasing injection","author":"maurine","year":"2012","journal-title":"Proc Yet Another Conf Cryptography"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_2"},{"key":"ref5","article-title":"Fault injection attacks on cryptographic devices: Theory, practice, and countermeasures","author":"barenghi","year":"2013","journal-title":"Proc Workshop Fault Diagnosis Tolerance Cryptogr"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2010.5560194"},{"key":"ref7","article-title":"Interaction laser-silicium et transport fibré pour le test de circuits intégrés par stimulation photoélectrique non-linéaire","author":"morisset","year":"2013"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0028165"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2013.02.021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0052259"},{"key":"ref20","article-title":"Extracting qualcomm's keymaster keys-Breaking android full disk encryption","year":"2017"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2016.18"},{"key":"ref21","first-page":"16","article-title":"BootStomp: On the security of bootloaders in mobile devices","author":"redini","year":"0","journal-title":"Proc 26th USENIX Security Symp"},{"key":"ref23","article-title":"PCB design guidelines for 0.4 mm package-on-package","author":"gutierrez","year":"2013"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/9187067\/08419264.pdf?arnumber=8419264","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T14:09:57Z","timestamp":1651068597000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8419264\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,1]]},"references-count":23,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tc.2018.2860010","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,10,1]]}}}