{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:50:11Z","timestamp":1771613411796,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61874047"],"award-info":[{"award-number":["61874047"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tc.2022.3184270","type":"journal-article","created":{"date-parts":[[2022,6,17]],"date-time":"2022-06-17T19:30:11Z","timestamp":1655494211000},"page":"1-14","source":"Crossref","is-referenced-by-count":16,"title":["LightWarner: Predicting Failure of 3D NAND Flash Memory Using Reinforcement Learning"],"prefix":"10.1109","author":[{"given":"Yuqian","family":"Pan","sequence":"first","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haichun","family":"Zhang","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Runze","family":"Yu","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5467-6597","authenticated-orcid":false,"given":"Zhaojun","family":"Lu","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haoming","family":"Zhang","sequence":"additional","affiliation":[{"name":"Haoming Zhang is with the Futurepath Technology (Wuhan) Co. Ltd., Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1546-3417","authenticated-orcid":false,"given":"Zhenglin","family":"Liu","sequence":"additional","affiliation":[{"name":"Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCNC.2012.6167470"},{"key":"ref2","first-page":"47","article-title":"Wear unleveling: Improving nand flash lifetime by balancing page endurance","volume-title":"Proc. 12th USENIX Conf. File Storage Technol.","author":"Jimenez"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/3126554"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3292040.3219659"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2909567"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2981025"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CIS.2013.6782154"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/NVMTS.2017.8171304"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.5064655"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/SOCC46988.2019.1570552892"},{"key":"ref11","first-page":"1","article-title":"Introduction","volume-title":"Reinforcement Learning: An Introduction","author":"Sutton","year":"2018"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1613\/jair.301"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-017-7512-0_2"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/computers6020016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-9431-5_4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2017.7939077"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3162616"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/2928275.2928278"},{"key":"ref19","first-page":"67","article-title":"Flash reliability in production: The expected and the unexpected","volume-title":"Proc. 14th Int. Conf. File Storage Technol.","author":"Schroeder"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-13-8285-7_2"},{"key":"ref21","first-page":"1","article-title":"Qualifying reliability of solid-state storage from multiple aspects","volume-title":"Proc. 7th IEEE Int. Workshop Storage Netw. Architecture Parallel I\/O","author":"Sun"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/2631919"},{"key":"ref23","article-title":"Failure mechanisms and models for semiconductor devices"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMI.2015.7494259"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/2463372.2463537"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-37207-0_22"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-74690-6_38"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.06.063"},{"key":"ref29","first-page":"47","article-title":"Finite markov decision processes","volume-title":"Reinforcement Learning: An Introduction","author":"Sutton","year":"2018"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2000964"},{"key":"ref31","first-page":"129","article-title":"Sarsa: On-policy TD control","volume-title":"Reinforcement Learning: An Introduction","author":"Sutton","year":"2018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-statistics-031219-041220"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2018.00050"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2018.00022"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/3369412.3395070"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TPDS.2020.2985346"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251188"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/4358213\/09799533.pdf?arnumber=9799533","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:32:51Z","timestamp":1706758371000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9799533\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tc.2022.3184270","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}