{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T09:00:59Z","timestamp":1765357259712,"version":"3.37.3"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2023,2,1]]},"DOI":"10.1109\/tc.2022.3224373","type":"journal-article","created":{"date-parts":[[2022,11,24]],"date-time":"2022-11-24T19:00:10Z","timestamp":1669316410000},"page":"414-422","source":"Crossref","is-referenced-by-count":7,"title":["(Adversarial) Electromagnetic Disturbance in the Industry"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6883-4074","authenticated-orcid":false,"given":"Arthur","family":"Beckers","sequence":"first","affiliation":[{"name":"imec-COSIC, KU Leuven, Leuven, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5044-3534","authenticated-orcid":false,"given":"Sylvain","family":"Guilley","sequence":"additional","affiliation":[{"name":"Secure-IC and Télécom Paris, Institut Polytechnique de Paris, Palaiseau, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9706-5710","authenticated-orcid":false,"given":"Philippe","family":"Maurine","sequence":"additional","affiliation":[{"name":"Laboratoire d’informatique, de robotique et de microelectronique de Montpellier, Montpellier, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Colin","family":"O'Flynn","sequence":"additional","affiliation":[{"name":"NewAE Technologies Inc., Halifax, NS, Canada"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7509-4337","authenticated-orcid":false,"given":"Stjepan","family":"Picek","sequence":"additional","affiliation":[{"name":"Radboud University, Nijmegen, The Netherlands"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"2021","key":"ref1","article-title":"2021 CWE most important hardware weaknesses"},{"key":"ref2","first-page":"9","article-title":"Design principles for tamper-resistant smartcard processors","volume-title":"Proc. USENIX Workshop Smartcard Technol.","author":"Kmmerling"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2012.15"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-36400-5_2"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2.386985"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2005.862424"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-42068-0_11"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2019.00010"},{"key":"ref10","article-title":"BAM bam!! on reliability of EMFI for in-situ automotive ECU attacks","volume-title":"IACR Cryptol. ePrint Arch.","author":"OFlynn","year":"2020"},{"article-title":"Radiation circumvention technique","year":"1983","author":"Sabo","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/1465611.1465708"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3003287"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC51366.2020.00012"},{"article-title":"BADFET: Defeating modern secure boot using second-order pulsed electromagnetic fault injection","volume-title":"Proc. 11th USENIX Workshop Offensive Technol.","author":"Cui","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2017.8311630"},{"key":"ref17","first-page":"949","article-title":"Magnetic microprobe design for em fault attack","volume-title":"Proc. Int. Symp. Electromagn. Compat.","author":"Omarouayache"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855583"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.216"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-16763-3_15"},{"article-title":"MIN()imum failure: EMFI attacks against USB stacks","volume-title":"Proc. 13th USENIX Workshop Offensive Technol.","author":"OFlynn","key":"ref21"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC53659.2021.00019"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.23919\/EMCTokyo.2019.8893692"},{"key":"ref24","first-page":"1","article-title":"Investigation of timing constraints violation as a fault injection means","volume-title":"Proc. 27th Conf. Des. Circuits Integr. Syst.","author":"Zussa"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC53659.2021.00018"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-29656-7"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140238"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-69053-0_4"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-26617-6_14"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2018.00014"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/359340.359342"},{"key":"ref32","article-title":"A generic countermeasure against fault injection attacks on asymmetric cryptography","volume":"2015","author":"Rauzy","year":"2015","journal-title":"IACR Cryptology ePrint Arch."},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-017-0167-4"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-89915-8_6"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"article-title":"Yet another fault injection technique: By forward body biasing injection","volume-title":"Proc. Yet Another Conf. Cryptography","author":"Maurine","key":"ref36"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.092"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/12.869328"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1145\/2744769.2747923"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1049\/iet-ifs.2010.0238"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3020921"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2016.14"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898065"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/AsianHOST.2017.8354004"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2017.7918333"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/10019338\/09961934.pdf?arnumber=9961934","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T03:25:46Z","timestamp":1706757946000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9961934\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2,1]]},"references-count":45,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tc.2022.3224373","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[2023,2,1]]}}}