{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T16:08:01Z","timestamp":1778947681512,"version":"3.51.4"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T00:00:00Z","timestamp":1711929600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2024,4]]},"DOI":"10.1109\/tc.2024.3351285","type":"journal-article","created":{"date-parts":[[2024,1,8]],"date-time":"2024-01-08T19:34:52Z","timestamp":1704742492000},"page":"1048-1059","source":"Crossref","is-referenced-by-count":6,"title":["Automated Test Cases Generator for IEC 61131-3 Structured Text Based Dynamic Symbolic Execution"],"prefix":"10.1109","volume":"73","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8993-7603","authenticated-orcid":false,"given":"Jianqi","family":"Shi","sequence":"first","affiliation":[{"name":"National Trusted Embedded Software Engineering Technology Research Center, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-0459-493X","authenticated-orcid":false,"given":"Yinghao","family":"Chen","sequence":"additional","affiliation":[{"name":"National Trusted Embedded Software Engineering Technology Research Center, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7476-4079","authenticated-orcid":false,"given":"Qin","family":"Li","sequence":"additional","affiliation":[{"name":"Shanghai Key Laboratory of Trustworthy Computing, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2102-4303","authenticated-orcid":false,"given":"Yanhong","family":"Huang","sequence":"additional","affiliation":[{"name":"National Trusted Embedded Software Engineering Technology Research Center, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-6034-5586","authenticated-orcid":false,"given":"Yang","family":"Yang","sequence":"additional","affiliation":[{"name":"National Trusted Embedded Software Engineering Technology Research Center, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-7005-4465","authenticated-orcid":false,"given":"Mengyan","family":"Zhao","sequence":"additional","affiliation":[{"name":"National Trusted Embedded Software Engineering Technology Research Center, East China Normal University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"IEC 61131-3: Programming Industrial Automation Systems","volume":"166","author":"Tiegelkamp","year":"2010"},{"key":"ref2","article-title":"Part 3: Programming languages","year":"2013"},{"key":"ref3","first-page":"209","article-title":"KLEE: Unassisted and automatic generation of high-coverage tests for complex systems programs,\u201d","volume-title":"Proc. 8th USENIX Symp. Oper. Syst. Des. Implementation (OSDI)","volume":"8","author":"Cadar","year":"2008"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/1095430.1081750"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"296","DOI":"10.1145\/3183519.3183554","article-title":"Smartunit: Empirical evaluations for automated unit testing of embedded software in industry","volume-title":"Proc. 40th Int. Conf. Softw. Eng.: Softw. Eng. Pract.","author":"Zhang","year":"2018"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/spe.4380250705"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-08867-9_36"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3106237.3106245"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/12.88471"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/12.88472"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.124"},{"key":"ref12","article-title":"Automated test generation for structured text language using UPPAAL model checker","author":"Markovic","year":"2015"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2015.7301602"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2351676.2351741"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA52439.2022.9921726"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/2786805.2786830"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3299771.3299799"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-98938-9_21"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WODES.2016.7497884"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3555776.3577698"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE59848.2023.00040"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3020266"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2015.81"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/12\/10470450\/10384480.pdf?arnumber=10384480","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,26]],"date-time":"2024-03-26T11:22:45Z","timestamp":1711452165000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10384480\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,4]]},"references-count":23,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tc.2024.3351285","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,4]]}}}