{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T02:06:57Z","timestamp":1755223617022,"version":"3.43.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62074116","81971702"],"award-info":[{"award-number":["62074116","81971702"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Wuhan Knowledge Innovation Project","award":["2023010201010077"],"award-info":[{"award-number":["2023010201010077"]}]},{"DOI":"10.13039\/501100021171","name":"Guangdong Basic and Applied Basic Research Foundation","doi-asserted-by":"publisher","award":["2021A1515110939"],"award-info":[{"award-number":["2021A1515110939"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory","award":["ZHD202302","23D06"],"award-info":[{"award-number":["ZHD202302","23D06"]}]},{"name":"Luojia Young Scholars Program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tc.2025.3585354","type":"journal-article","created":{"date-parts":[[2025,7,2]],"date-time":"2025-07-02T13:43:50Z","timestamp":1751463830000},"page":"3129-3142","source":"Crossref","is-referenced-by-count":0,"title":["A High-Intensity Solution of Hardware Accelerator for Sparse and Redundant Computations in Semantic Segmentation Models"],"prefix":"10.1109","volume":"74","author":[{"given":"Jiahui","family":"Huang","sequence":"first","affiliation":[{"name":"Hongyi Honor College, Wuhan University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-2648-6824","authenticated-orcid":false,"given":"Zhan","family":"Li","sequence":"additional","affiliation":[{"name":"School of Physics and Technology, Wuhan University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-3128-9304","authenticated-orcid":false,"given":"Yuxian","family":"Jiang","sequence":"additional","affiliation":[{"name":"Hongyi Honor College, Wuhan University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-8864-9143","authenticated-orcid":false,"given":"Zhihan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Physics and Technology, Wuhan University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5279-3645","authenticated-orcid":false,"given":"Hao","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Physics and Technology, Wuhan University, Wuhan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4875-5501","authenticated-orcid":false,"given":"Sheng","family":"Chang","sequence":"additional","affiliation":[{"name":"School of Physics and Technology and the School of Microelectronics, Wuhan University, Wuhan, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/csicc52343.2021.9420573"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/icip42928.2021.9506098"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tip.2019.2905081"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.550"},{"article-title":"ENet: A deep neural network architecture for real-time semantic segmentation","year":"2016","author":"Paszke","key":"ref5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01249-6_34"},{"article-title":"Rethinking \u00e0-trous convolution for semantic image segmentation","year":"2017","author":"Chen","key":"ref7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.660"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/micro56248.2022.00094"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2022.3197489"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2021.3078691"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2021.3087946"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2019.2941875"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2022.3198246"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2021.3110413"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2020.3033730"},{"key":"ref17","article-title":"Multi-scale context aggregation by dilated convolutions","volume-title":"Proc. 4th Int. Conf. Learn. Represent. (ICLR)","author":"Yu","year":"2016"},{"article-title":"Attention is all you need","year":"2017","author":"Vaswani","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/3581783.3612857"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/cvprw59228.2023.00442"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/icicta.2014.82"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00802"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2021.3055240"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2019.2905242"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/icta50426.2020.9331980"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2019.8702243"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2020.2976454"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/icta60488.2023.10364302"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/asap49362.2020.00022"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/iccc54389.2021.9674465"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2018.2881162"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2020.2995593"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2022.3174585"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2018.00286"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.350"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2024.3423664"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/asap49362.2020.00022"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2022.3233882"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ghtc46280.2020.9342625"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240775"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10030282"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2021.3131581"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/3570928"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530424"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/fpl.2019.00037"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/12\/11121311\/11062861.pdf?arnumber=11062861","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,12]],"date-time":"2025-08-12T05:30:23Z","timestamp":1754976623000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11062861\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":45,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tc.2025.3585354","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"type":"print","value":"0018-9340"},{"type":"electronic","value":"1557-9956"},{"type":"electronic","value":"2326-3814"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}