{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T15:42:36Z","timestamp":1780587756319,"version":"3.54.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,3,1]],"date-time":"2026-03-01T00:00:00Z","timestamp":1772323200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001843","name":"Science and Engineering Research Board","doi-asserted-by":"publisher","award":["CRG\/2023\/003715"],"award-info":[{"award-number":["CRG\/2023\/003715"]}],"id":[{"id":"10.13039\/501100001843","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Department of Science and Technology-Science and Engineering Research Board","award":["EEQ\/2022\/000023"],"award-info":[{"award-number":["EEQ\/2022\/000023"]}]},{"DOI":"10.13039\/100020918","name":"Indian National Academy of Engineering","doi-asserted-by":"crossref","award":["2024\/INTW\/05"],"award-info":[{"award-number":["2024\/INTW\/05"]}],"id":[{"id":"10.13039\/100020918","id-type":"DOI","asserted-by":"crossref"}]},{"name":"National Quantum Mission","award":["DST\/QTC\/NQM\/QC\/2024\/1"],"award-info":[{"award-number":["DST\/QTC\/NQM\/QC\/2024\/1"]}]},{"name":"ANRF Pair","award":["ANRF\/PAIR\/2025\/000002\/PAIR"],"award-info":[{"award-number":["ANRF\/PAIR\/2025\/000002\/PAIR"]}]},{"DOI":"10.13039\/501100001659","name":"German Research Foundation","doi-asserted-by":"crossref","award":["AM 534\/5-1"],"award-info":[{"award-number":["AM 534\/5-1"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput."],"published-print":{"date-parts":[[2026,3]]},"DOI":"10.1109\/tc.2025.3649150","type":"journal-article","created":{"date-parts":[[2025,12,29]],"date-time":"2025-12-29T18:37:48Z","timestamp":1767033468000},"page":"1197-1208","source":"Crossref","is-referenced-by-count":1,"title":["Evaluation of Radiation Resilience, Performance, and V\n                    <sub>min<\/sub>\n                    of Sub-3\u2009nm FSFET Based SRAM Arrays"],"prefix":"10.1109","volume":"75","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-4679-8007","authenticated-orcid":false,"given":"Hafeez","family":"Raza","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT), Kanpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8982-2902","authenticated-orcid":false,"given":"Mahdi","family":"Benkhelifa","sequence":"additional","affiliation":[{"name":"Munich Institute of Robotics and Machine Intelligence, Technical University of Munich, TUM School of Computation, Information and Technology, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-4520-2548","authenticated-orcid":false,"given":"Koshal","family":"Kumar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT), Kanpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7104-2396","authenticated-orcid":false,"given":"Shivendra Singh","family":"Parihar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3356-8917","authenticated-orcid":false,"given":"Yogesh","family":"Singh Chauhan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT), Kanpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5649-3102","authenticated-orcid":false,"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"Munich Institute of Robotics and Machine Intelligence, Technical University of Munich, TUM School of Computation, Information and Technology, Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1440-0841","authenticated-orcid":false,"given":"Avinash","family":"Lahgere","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology (IIT), Kanpur, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3138849"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2700818"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/OJCAS.2023.3309478"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3278351"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2885536"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2025.3560215"},{"key":"ref7","first-page":"104","article-title":"Design of radiation hardened 12T SRAM with enhanced reliability and read\/write latency for space application","volume-title":"Proc. Int. Conf. VLSI Des. Int. Conf. Embedded Syst. (VLSID)","author":"Reniwal","year":"2023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3343316"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3085516"},{"key":"ref10","first-page":"1","article-title":"Forksheet FETs for advanced CMOS scaling: Forksheet-nanosheet co-integration and dual work function metal gates at 17nm N-P space","volume-title":"Proc. Symp. VLSI Technol.","author":"Mertens","year":"2021"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3362822"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JXCDC.2025.3568622"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3215657"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT51558.2021.9626531"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3018328"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS45951.2020.9129165"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2949064"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3088392"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSITechnologyandCir46769.2022.9830190"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2504729"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3150645"},{"key":"ref22","article-title":"BSIM-CMG technical manual","year":"2022"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2023.3298290"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2018.2877882"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2020.3002265"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2004.1283724"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3381935"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2158708"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2327334"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/FTFC.2014.6828617"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.chip.2023.100082"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2008.16"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2011.6131495"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2770158"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2281474"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885649"},{"key":"ref38","article-title":"Device and circuit techniques for reducing variation in nanoscale SRAM","author":"Carlson","year":"2008"}],"container-title":["IEEE Transactions on Computers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/12\/11392777\/11318137.pdf?arnumber=11318137","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T20:58:54Z","timestamp":1770929934000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11318137\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,3]]},"references-count":38,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tc.2025.3649150","relation":{},"ISSN":["0018-9340","1557-9956","2326-3814"],"issn-type":[{"value":"0018-9340","type":"print"},{"value":"1557-9956","type":"electronic"},{"value":"2326-3814","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,3]]}}}